The invention relates to a terahertz wave single-shot measuring device and method based on cross polarized wave spectrum broadening. The measuring device comprises the steps that light emitted by a
femtosecond laser light source is split into reflected light and transmission light after passing through a
beam splitting piece; the reflected light is used as pump light for generating terahertz
waves, and the generated terahertz
waves are collected by a parabolic mirror and focused on an electro-optical
crystal; transmission light sequentially passes through a first reflecting mirror, a diaphragm, a half-wave plate, a first linear
polarizer, a lens combination and a plurality of third-order nonlinear
crystal combinations to generate cross-polarized
waves with broadened frequency spectrums; the generated cross polarized wave is broadened by the chirped pulse to serve as new detection light, the new detection light is further focused on the electro-optical
crystal through the lens and coincides with the focus of the terahertz wave, the detection light modulated by the electro-optical effect is collected by the
spectrograph, a spectrum is detected, and single-shot measurement of the terahertz wave is achieved. Compared with the prior art, the method has the advantages of high
time resolution, high
signal-to-
noise ratio and the like for single-shot measurement of terahertz waveforms.