Accurate Position Correction Method of Spot Array of Snapshot Imaging Spectrometer

An imaging spectrometer and calibration method technology, applied in the field of spectrometers, can solve the problems of unextracted bright spots and reduce the spectral calibration accuracy of snapshot video imaging spectrometers, and achieve the effects of avoiding spectral calibration interference and improving spectral calibration accuracy

Active Publication Date: 2022-07-15
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0002] The extraction of bright spots on the background target surface in the prior art is mainly realized by setting a global threshold, resulting in some areas of the target surface still having some bright spots not extracted or extracting invalid bright spots, thus seriously reducing the snapshot video imaging performance. Spectrometer Spectral Calibration Accuracy

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  • Accurate Position Correction Method of Spot Array of Snapshot Imaging Spectrometer
  • Accurate Position Correction Method of Spot Array of Snapshot Imaging Spectrometer
  • Accurate Position Correction Method of Spot Array of Snapshot Imaging Spectrometer

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Embodiment approach

[0047] In a preferred embodiment, the lattice is formed by mercury lamp spots.

[0048] In a preferred embodiment, the punctuation coordinates of the dot matrix are as follows: the coordinates of the points in the first row and the first column are (x 1 ,y 1 ), the coordinates of the point in the mth column of the first row are (x m ,y 1 ), the coordinates of the points in the first column of the nth row are (x 1 ,y n ).

[0049] In a preferred embodiment, the step size between the lateral directions of each sub-region is The step size between the vertical directions of each subregion is

[0050] The specific operations of this method are: firstly dividing sub-regions, then updating the threshold for each sub-region, performing T'(i, j) calculation, then confirming the sub-region bright spot position, and finally, determining the validity of the bright spot.

[0051] Divide sub-regions: with Divide the entire target surface into m×n rectangular sub-regions for the st...

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Abstract

The invention discloses a method for correcting the precise position of a spot array of a snapshot-type imaging spectrometer. By selecting the spot array in the whole target surface, and then dividing the rectangular sub-regions, the threshold value of each sub-region is obtained through a histogram algorithm, and then the threshold value of each sub-region is obtained according to a sub-region The initial threshold and weight coefficient of the adjacent sub-regions represent the optimal threshold of the central region, and then determine the location of the bright spot in the sub-region, and finally determine whether it is a valid point. The method realizes the extraction of valid points and the elimination of invalid points, so as to avoid the interference of invalid bright spots on spectral calibration.

Description

technical field [0001] The invention belongs to the technical field of spectrometers, and in particular relates to a method for correcting the precise position of a spot array of a snapshot imaging spectrometer. Background technique [0002] The bright spot extraction of the background target surface in the prior art is mainly realized by setting a global threshold, resulting in some areas on the target surface still having some bright spots not extracted or invalid bright spots extracted, thus seriously reducing the snapshot video imaging. Spectrometer spectral calibration accuracy. SUMMARY OF THE INVENTION [0003] In order to solve the above problems, the present invention provides a method for correcting the precise position of the spot array of a snapshot imaging spectrometer, which includes the following steps: [0004] S1: Select m×n lattices in the whole target surface; [0005] S2: Divide the above target surface into m×n rectangular sub-regions, and calculate t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/27
CPCG01N21/274
Inventor 杨晋王明佳冯树龙陈佳奇孙慈宋楠赵梓彤于昌本王添一
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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