Spectrum calibration method, device and equipment of echelle spectrometer, and storage medium

Abstract

The invention discloses a spectrum calibration method, a spectrum calibration device and spectrum calibration equipment of an echelle spectrometer, and a storage medium. The spectrum calibration method comprises the steps of: calculating coordinate deviation values of light spot positions of a mercury lamp of a current frame at different wavelengths by utilizing an image processing algorithm; andgenerating an instruction that a rotation angle of a detector assembling and adjusting position does not meet requirements if the coordinate deviation values are not within a deviation allowable range, wherein the deviation allowable range is determined based on a coordinate deviation standard curve and a threshold value, the coordinate deviation standard curve is obtained by fitting the coordinate deviation values of light spot positions with different wavelengths and corresponding position deviation values, and the position deviation values are deviation values of a theoretical position of acharacteristic spectrum design model and an actual position of a detector light spot at the optimal matching position. According to the spectrum calibration method, the spectrum calibration device and the spectrum calibration equipment, the problem that the spectral calibration precision is reduced due to the rotation of the light spot positions relative to an optical system in the prior art is solved, the installation and debugging precision of the echelle spectrometer detector is ensured, and the spectral calibration precision of the echelle spectrometer is effectively improved.

Description

technical field [0001] The present application relates to the technical field of echelle spectrometer application, in particular to a spectral calibration method, device, equipment and computer-readable storage medium for an echelle spectrometer. Background technique [0002] Echelle spectrometers are widely used due to their many advantages such as online measurement, non-contact, and high measurement accuracy. For example, echelle spectrometers are usually used to obtain the content of each element of the measured object by measuring the spectral response curve of the substance. Specifically, using the one-to-one correspondence between the spectrum and the detector target surface in the echelle spectrometer, the position and energy of the imaging spot of the detector are calculated, and the spectral response curve of the substance to be measured is obtained. Measure the content of each element in a substance. [0003] When measuring the spectral response curve of substanc...

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Problems solved by technology

[0007] However, when the installation angle of the detector rotates, the position of the imaging spot also rotates, and the theoretical model does not have the ability to resist rotation when matching

Therefore, once the detector target surface is rotated during the installation process, or the spot position is rotated relative to the optical system, a large deviation will occur in the matching process between the characteristic spectrum design model and the actual position, which seriously reduces the spectral calibration accuracy of the echelle spectrometer

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