System and method for generating defect image of electronic component

Abstract

The invention provides a flaw image generation system and method for an electronic component, and the system and method comprise the steps: obtaining a first flaw image of the electronic component, detecting a target flaw part of the electronic component, obtaining a flaw part image, obtaining a flaw feature image of the flaw part image, and obtaining a flaw feature image of the flaw feature image; performing image overlapping on positions corresponding to the defect feature image and the normal electronic component image to obtain a false image, and analyzing and comparing the false image by an artificial intelligence generative adversarial network to generate a sufficient number of approximately real second defect images; and providing the second flaw images which are sufficient in quantity and approximate to reality for the artificial intelligence classification and judgment model, so that the artificial intelligence classification and judgment model has sufficient data for training, learning, analysis and judgment.

Description

technical field [0001] The invention relates to a method for generating realistic defect images, in particular to a system and method for generating defect images of electronic components. Background technique [0002] With the upgrading of industrial technology, intelligent manufacturing has become a hot development trend. In addition to improving production quality and production efficiency, intelligent manufacturing can also save labor costs. At present, the main technology of intelligent manufacturing is to make production machines more human-like through big data analysis, deep learning and artificial intelligence (unsupervised learning, supervised learning, semi-supervised learning, semi-supervised self-learning and reinforcement learning, etc.). Think logic and behavior patterns. However, these technologies are not only able to be applied to the equipment of various factories with the machine equipment and the ability to strengthen the development of artificial intel...

AI Technical Summary

Problems solved by technology

[0005] In view of the problems raised by the existing technology, solve the problem that the artificial intelligence classification judgment model relies on a large amount of meaningful data in classification learning, especially for the classification and judgment of electronic component defect images, and cannot obtain enough defect images

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