Full field of view scatter estimation for DAX imaging
An X-ray and scatterometry technology, applied in the field of X-ray imaging systems, can solve problems such as the destruction of dark field images or phase contrast images, and achieve the effect of preventing scattering artifacts and accurate scattering correction
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0028] refer to figure 1 , shows a schematic block diagram of an image processing arrangement IA comprising a computerized image processing system IPS and an X-ray imaging device XI ("imager"). The x-ray imaging device is configured for dark field x-ray ("DAX") imaging and / or phase contrast ("Φ") imaging. The imaging device XI comprises an X-ray source XR and an X-radiation sensitive detector D. Imager XI may be configured for 2D radiographic imaging or 3D imaging such as a CT scanner.
[0029] The image processing system IPS may run as one or more software modules or routines on one or more data processing units PU (eg one or more computers, servers, etc.). The IPS may be arranged externally and remotely from the imager XI, or the IPS may be integrated into the imager XI, for example into a workstation associated with the imager XI or into an operator operator console. The image processing system IPS may be implemented in a distributed architecture to serve a group of imag...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap