Phase deflection measurement method and system based on curved screen, and terminal

A measurement method and phase deviation technology, applied in the field of optical measurement, can solve the problems of affecting the reconstruction of the three-dimensional shape of the highly reflective object to be measured, and unable to obtain complete phase information, so as to improve the reconstruction effect and expand the irradiation range.

Active Publication Date: 2021-11-16
SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The embodiment of the present application provides a phase deflection measurement method, system and terminal based on a curved screen to solve the problem that the existing phase deflection measurement system cannot obtain the complete phase information of the object surface with a large curvature, which affects the height of the object to be measured. The problem of 3D shape reconstruction of reflective objects

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  • Phase deflection measurement method and system based on curved screen, and terminal
  • Phase deflection measurement method and system based on curved screen, and terminal
  • Phase deflection measurement method and system based on curved screen, and terminal

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Embodiment Construction

[0026] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0027] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other features. , whole, step, operation, element, component and / or the presence or addition of a collection thereof.

[0028] It shou...

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Abstract

The invention is suitable for the technical field of optical measurement, and provides a phase deflection measurement method, system and terminal based on a curved screen, and the method comprises the steps: sequentially displaying a set number of phase shift fringe patterns on a curved display screen, and controlling an image collector to carry out the image collection of a to-be-measured object, and respectively obtaining a first virtual image corresponding to each phase shift fringe pattern, and performing three-dimensional surface type reconstruction on the to-be-measured object by adopting a phase deflection technology based on the relative pose relationship between the curved surface display screen and the image collector and the first virtual image. According to the scheme, the complete phase information of the surface of the object with the large curvature can be obtained, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.

Description

technical field [0001] The present application belongs to the technical field of optical measurement, and in particular relates to a phase deflection measurement method, system and terminal based on a curved screen. Background technique [0002] Non-contact, high-precision measurement of specular reflective surfaces has become an important scientific issue in the field of 3D optical measurement. The diffuse reflection structured light measurement method is no longer applicable because the characteristic information of the measured surface cannot be obtained. Due to its simple principle, low cost, large dynamic measurement range, and fast full-field measurement, the phase deflection technique is more widely used in the topography measurement of the surface of highly reflective objects. [0003] In the existing application of phase deflection technique, the measurement effect is the best for relatively flat and highly reflective objects, but when the highly reflective object ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G01M11/04
CPCG01M11/02G01M11/04
Inventor 宋展韩浩
Owner SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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