Defect analysis device based on X-ray flaw detection image
A defect analysis and X-ray technology, applied in the field of non-destructive testing, can solve the problems of unsatisfactory imaging resolution, affecting the accuracy of part quality evaluation, large errors, etc., and achieve high imaging resolution, accurate detection results, and improved detection efficiency. Effect
Active Publication Date: 2022-02-08
山东胜宁电器有限公司
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However, this method has unsatisfactory imaging resolution, which leads to large errors in the subsequent defect classification process, which affects the accuracy of part quality assessment
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[0026] It should be noted that the following detailed description is exemplary and intended to provide further explanation of the present invention. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
[0027] In the description of the present invention, the terms "transverse", "longitudinal", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", " The orientation or positional relationship indicated by "top", "bottom", "inner", "outer" and so on are based on the orientation or positional relationship shown in the drawings, and do not limit the structure, but are only for the convenience of describing the present invention, rather than Nothing indicating or implying that a referenced device or element needs to have a particular orientation, be constructed and operate in a particular orientation should not be construed as...
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The invention relates to the technical field of nondestructive testing, in particular to a defect analysis device based on an X-ray flaw detection image. The device comprises a focus lens and a transmitted light receiver which are arranged in a detection table, the detection table is horizontally fixed on a rotating shaft of a first rotating motor, the first rotating motor is vertically fixed on a lifting platform below the first rotating motor, and the lifting platform is fixed on a lifting mechanism. An X-ray gun is fixed above the detection table and obliquely faces the upper surface of the detection table. The first rotating motor, the lifting mechanism and the X-ray gun are all connected with a control cabinet. A reflected light receiver is arranged above the detection table and is positioned on the opposite side of the X-ray gun. The transmitted light receiver and the reflected light receiver are both connected with an imaging and analyzing system. The analysis device can perform transmission and reflection ray imaging on the same measurement position, effectively improves the resolution of defect images, can automatically complete classification of defect types, and effectively improves the detection efficiency.
Description
technical field [0001] The invention relates to the technical field of nondestructive testing, in particular to a defect analysis device based on X-ray flaw detection images. Background technique [0002] The following content in the background technology only refers to the information related to the present invention understood by the inventor, and aims to increase the understanding of the present invention by explaining some basic technical knowledge related to the present invention. Knowledge known to those of ordinary skill in the art. [0003] X-ray flaw detection is a non-destructive testing method that uses X-rays to penetrate substances and have attenuation characteristics in substances to find defects. X-ray flaw detection has the advantages of high sensitivity and is suitable for the detection of internal defects of various materials. It has been widely used in the quality inspection of various instruments and devices. Although X-rays travel in a straight line at...
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IPC IPC(8): G01N23/04
CPCG01N23/04
Inventor 王云岗董禄友
Owner 山东胜宁电器有限公司