Method and device for processing wafer yield data
A technology of wafer yield rate and data, applied in the direction of electrical digital data processing, input/output process of data processing, instruments, etc., can solve problems such as inability to process wafer yield rate data, achieve the purpose and advantages of simple and easy to understand Effect
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[0052] In order to make the objectives, technical solutions and advantages of the present application clearer, the present application will be described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application. Based on the embodiments provided in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present application. In addition, it will also be appreciated that while such development efforts may be complex and lengthy, for those of ordinary skill in the art to which the present disclosure pertains, the techniques disclosed in this application Some changes in design, manufacture or production based on the content are only conventional technical means, and it should not be understood that ...
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