Aperture impedance testing device and method and aperture shielding structure of server case

A technology of impedance testing and shielding structure, which is applied in the direction of measuring devices, measuring resistance/reactance/impedance, instruments, etc., can solve the problems affecting the analysis of hole impedance and large measurement errors, so as to optimize the design of shielding structure, reduce impedance, reduce The effect of test error

Pending Publication Date: 2022-05-13
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Claims
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Problems solved by technology

[0004] The present application provides a hole impedance testing device, method and a hole shielding structure of a server case, in order to solve the problem in the related art that the measurement error is relatively large when testing the surface material of the server case that has passed the aging test, thus affecting the hole impedance analysis. question

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  • Aperture impedance testing device and method and aperture shielding structure of server case
  • Aperture impedance testing device and method and aperture shielding structure of server case
  • Aperture impedance testing device and method and aperture shielding structure of server case

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Embodiment Construction

[0028] In order to make the objectives, technical solutions and advantages of the embodiments of the present application more clear, each embodiment of the present application will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can understand that, in each embodiment of the present application, many technical details are provided for the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in the present application can be realized. The following divisions of the various embodiments are for the convenience of description, and should not constitute any limitation on the specific implementation manner of the present application, and the various embodiments may be combined with each other and referred to each other on the premise of not contradicting each other....

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Abstract

The invention discloses an aperture impedance testing device and method and an aperture shielding structure of a server case, and the testing device comprises a double-terminal impedance meter and two terminal probes connected to the double-terminal impedance meter, and the two terminal probes are fixed together in an insulated and attached manner and are arranged in a conical shape. The top of the terminal probe can be inserted into the aperture, and the outer surface of the terminal probe is in contact with the aperture. Two traditional independent terminal probes are combined together in an insulated mode, the tip of the combined terminal probe extends into the aperture to achieve testing during testing, testing errors can be reduced, and impedance of the aperture can be accurately measured.

Description

technical field [0001] The present application relates to the technical field of data processing equipment, and in particular, to a device and method for aperture impedance testing and a slot shielding structure for a server chassis. Background technique [0002] Aging test is a test that electronic products must carry out, although the function of electronic products that pass the aging test can still maintain normal. However, after the aging test, the components and chassis of electronic products will be affected to varying degrees, and these effects are likely to affect the performance of anti-static and anti-radiation in electromagnetic compatibility. Especially in the case of a server, there are inevitably many holes and seams. After the aging test, the holes and seams will corrode invisible to the naked eye. This kind of corrosion will affect the grounding impedance of the holes and seams. Since the shielding effectiveness of the server chassis is inversely proportion...

Claims

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Application Information

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IPC IPC(8): G01R27/08G01B5/14
CPCG01R27/08G01B5/14
Inventor 党杰
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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