AFM-based data storage and micrascopy

Abstract

Read / write components for AFM-based data storage devices are provided. In particular embodiments, a read / write component (30, 45, 50, 65, 80) comprises lever means (31, 51, 66, 82) and a support structure (32, 52, 67, 81), the lever means being connected to the support structure for substantially pivotal movement. The lever means (31, 51, 66, 82) provides first and second current paths between a pair of electrical supply lines (R, C) on the support structure via which the lever means can be connected in use to power supply means operable in a write mode and a read mode. A write-mode heater (36, 47, 56, 73) is provided on the lever means in the first current path, and a read / write tip (37, 57, 74, 84) is provided on the write-mode heater. A read-mode heater (39, 46, 58, 75, 83) is provided on the lever means in the second current path. Decoupling means (38a, 38b, 40a, 40b, 60, 61, 77a, 77b, 78a, 78b) is arranged to inhibit current flow to the write-mode heater via the first current path in use when the power supply means is operated in the read mode. The component, with separate write and read-mode heaters, can thus be addressed in both the write and read modes via a single pair of supply lines. Other embodiments provide read / write components (100) employing a thermal decoupling mechanism, and read / write components (80) where read-sensing is performed by a proximity sensing arrangement between the lever means and the support structure. Sensing apparatus (115) for atomic force microscopes is also provided where tip movement can be detected via similar proximity sensing arrangements.

Description

technical field [0001] The present invention relates to AFM (Atomic Force Microscopy) based data storage and microscope systems. Particular embodiments of the present invention provide read / write means for data storage devices and detection means for atomic force microscopes. Background technique [0002] Atomic force microscopy is now a well-known device in which the topography of a sample is probed by a probe mounted at the end of a microcantilever. As the sample is scanned, the atomic force interaction between the nanometer-sensitive probe and the sample surface causes the pivot of the cantilever to deflect. The sample topography is determined by detecting this deflection. AFM technology is also being applied in the field of data storage in order to provide a new generation of high-density high data rate data storage devices for mass memory applications. AFM-based Data Storage, which is incorporated herein by reference. Here, a probe mounted on a cantilever is used t...

AI Technical Summary

Problems solved by technology

However, heater platform design must compromise between write requirements and read requirements in individual parts, and this limits operating efficiency in both write and read modes

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