A 
field emission device, which among other things may be used within an ultra-
high density storage 
system, is disclosed. The emitter device includes an emitter 
electrode, an extractor 
electrode, and a 
solid-state field controlled emitter that utilizes a Schottky 
metal-
semiconductor junction or barrier. The Schottky 
metal-
semiconductor barrier is formed on the emitter 
electrode and electrically couples with the extractor electrode such that when an 
electric potential is placed between the emitter electrode and the extractor electrode, a field emission of electrons is generated from an exposed surface of the 
semiconductor layer. Further, the Schottky 
metal may be selected from typical conducting 
layers such as 
platinum, gold, silver, or a conductive semiconductor layer that is able to provide a 
high electron pool at the barrier. The semiconductor layer placed on the Schottky metal is typically very weakly conductive of n-type and has a 
wide band gap in order to create conditions conducive to creating induced negative 
electron affinity at applied fields necessary to provide 
electron emission. One type of 
wide band-gap material can be selected from 
titanium dioxide or 
titanium nitride or other comparable materials.