A
field emission device, which among other things may be used within an ultra-
high density storage
system, is disclosed. The emitter device includes an emitter
electrode, an extractor
electrode, and a
solid-state field controlled emitter that utilizes a Schottky
metal-
semiconductor junction or barrier. The Schottky
metal-
semiconductor barrier is formed on the emitter
electrode and electrically couples with the extractor electrode such that when an
electric potential is placed between the emitter electrode and the extractor electrode, a field emission of electrons is generated from an exposed surface of the
semiconductor layer. Further, the Schottky
metal may be selected from typical conducting
layers such as
platinum, gold, silver, or a conductive semiconductor layer that is able to provide a
high electron pool at the barrier. The semiconductor layer placed on the Schottky metal is typically very weakly conductive of n-type and has a
wide band gap in order to create conditions conducive to creating induced negative
electron affinity at applied fields necessary to provide
electron emission. One type of
wide band-gap material can be selected from
titanium dioxide or
titanium nitride or other comparable materials.