Active driving pixel structure and its checking method

Abstract

In an active-drive type pixel structure comprising at least TFT for control, TFT for drive, and a capacitor for charge retention, it can be easily inspected whether the functions of TFTs and the capacitor are normal or not. In an active-drive type pixel structure comprising TFT (Tr1) for control, TFT (Tr2) for drive, and a capacitor for charge retention, one terminal of a dummy load W for inspection is connected to a drain of the TFT for drive, and the other terminal of the load W is connected to a line 3 for inspection. By measuring an electric current Id obtained on the line 3 for inspection while changing a voltage supplied to a data line 2a, it can be inspected whether the functions of TFTs and the capacitor are normal or not. The dummy load W is configured to be melted and cut by burning off the load W with a laser beam or by passing a predetermined electric current in the load W after completion of inspection.

Description

technical field [0001] The present invention relates to an active-driven pixel structure including at least a control TFT and a driving TFT, and a charge storage capacitor, and an inspection method thereof. In particular, it relates to the ability to detect, before forming a film of, for example, a light-emitting element constituting a pixel. An active driving type pixel structure and an inspection method thereof for easily inspecting whether the above-mentioned TFT (Thin Film Transistor) and the capacitor for charge storage are functioning normally. Background technique [0002] The development of a display using a display panel configured by arranging light-emitting elements in a matrix is ​​widely progressing. As a light-emitting element used in such a display panel, an organic EL (electroluminescence) element using an organic material as a light-emitting layer is attracting attention. The use of organic compounds that can be expected to obtain good light-emitting charac...

AI Technical Summary

Problems solved by technology

[0014] However, as described above, in the process of inspecting pixel defects, when an operation such as bringing conductive needles and the like into contact with electrodes forming the EL element as a light-emitting element, the electrode may be damaged or the like may cause defects in the light-emitting element. sex increases and is therefore not ideal

In addition, it is also considered that by bringing the inspection electrode close to the electrode forming the light-emitting element, a capacitor is formed between the two electrodes, and a method of applying a load to the driving TFT in a non-contact state is adopted, but the gap between the two electrodes is adjusted. Difficult, this method can be used in practice

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