Transient strong electromagnetic pulse testing device

A pulse test, strong electromagnetic technology, applied in the direction of measuring devices, electromagnetic field characteristics, measuring electricity, etc., can solve the problems of electromagnetic radiation damage to testers, test equipment is susceptible to interference, and high-energy electromagnetic pulse field test technology lags behind, etc., to achieve Accurate measurement results and improved anti-interference ability

Inactive Publication Date: 2006-12-13
CHINA SHIP DEV & DESIGN CENT
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, in the research of testing, protection technology and measures of transient high-energy electromagnetic pulses, the research and development of high-energy electromagnetic pulse field generators has made great progress; however, the testing technology of high-energy electromagnetic pulse fields is relatively lagging behind and can only test Transient stro...

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  • Transient strong electromagnetic pulse testing device
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Embodiment Construction

[0012] The embodiment of the present invention is described in detail below in conjunction with the accompanying drawings, which consists of three parts: a transient strong electromagnetic pulse test probe, a transient strong electromagnetic pulse test host and a digital storage oscilloscope. The transient strong electromagnetic pulse test probe includes a shielded antenna 1 and a fully shielded probe box 3. The antenna is a monopole antenna with a shield 2 on the periphery and has no directionality. It can be changed by adjusting the length of the exposed shield. The measurement range of the test instrument; the fully shielded probe box is equipped with an impedance conversion circuit, a follower circuit and an electro-optical conversion circuit, and the signal of the antenna is input to the impedance conversion circuit through the interface J2 and the capacitor C1. The impedance conversion circuit includes a field effect transistor Q1 (BFR30), a high-frequency transistor Q2 (...

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Abstract

The invention relates to a device for detecting instantaneous strong electromagnetic pulse. The device comprises an instantaneous strong electromagnetic pulse detecting probe, an instantaneous strong electromagnetic pulse detecting host machine and a digital memory oscillograph. Wherein the instantaneous strong electromagnetic pulse detecting probe includes antenna and a full screening probe box which is equipped with a resistance varying circuit, a tracking circuit and a electricity-photo converting circuit; the instantaneous strong electromagnetic pulse detecting host machine includes a photo-electricity converting circuit, a signal processing circuit; the instantaneous strong electromagnetic pulse detecting host machine and the instantaneous strong electromagnetic pulse detecting probe are connected via fiber; the output end of the instantaneous strong electromagnetic pulse detecting host machine is connected with the digital memory oscillograph.

Description

technical field [0001] The invention relates to a test device for detecting transient strong electromagnetic pulses, which belongs to the field of electromagnetic compatibility testing and is suitable for measuring transient strong electromagnetic pulses whose rise time is at least 2 ns. Background technique [0002] Due to the huge destructive power of transient strong electromagnetic pulses on electronic information equipment, more and more attention has been paid to the testing technology of transient strong electromagnetic pulses. According to relevant regulations, anti-transient strong electromagnetic pulse radiation fields have been proposed for related electronic and electrical equipment. Require. At present, in the research of testing, protection technology and measures of transient high-energy electromagnetic pulses, the research and development of high-energy electromagnetic pulse field generators has made great progress; however, the testing technology of high-ene...

Claims

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Application Information

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IPC IPC(8): G01R29/08G01R31/00
Inventor 宋文武刘义易学勤陈久春张传东温定娥
Owner CHINA SHIP DEV & DESIGN CENT
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