Method for reproducibly determining object characteristics
a technology of object characteristics and reproducible determination, applied in the field of reproducible determination of object characteristics, can solve the problems of linear variations of original detected brightness measurement results that are practically harmless, and the residual error is still relatively larg
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[0033]FIG. 1 shows a coordinate measuring machine 1, as it has been used for some time in the prior art for measuring structures on masks and / or wafers. Substrates 2 can be optically inspected and measured using the coordinate measuring machine 1 of the exemplary embodiment shown in FIG. 1. A substrate 2 according to the present invention is, for example, a mask or a wafer used for the manufacture of semiconductors. A plurality of objects 3 are applied to a substrate 2, which can be measured with the aid of coordinate measuring machine 1. Coordinate measuring machine 1 includes two illumination beam paths 4 and 5, wherein illumination beam path 4 is provided for the transmitted-light mode, and illumination beam path 5 is provided for the incident-light mode. A light source 6 is provided for the transmitted-light mode, which passes the light via a mirror 7 towards a condenser 8. The light in illumination beam path 4 passes through substrate 2 and is at least substantially collected b...
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