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Implementing screening for single fet compare of physically unclonable function (PUF)

a technology of physical unclonable function and screening method, applied in the field of data processing, can solve the problems of application dependent circuits and inflexible with changing field conditions

Active Publication Date: 2013-05-02
MARVELL ASIA PTE LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0007]Principal aspects of the present invention are to provide a method and circuit for implementing screening for a single field effect transistor (FET) compare Physically Unclonable Function (PUF) utilizing a low-offset dynamic comparator, and a design structure on which the subject circuit resides. Other important aspects of the present invention are to provide such method, circuit and design structure substantially without negative effects and that overcome many of the disadvantages of prior art arrangements.

Problems solved by technology

Disadvantages of the disclosed single FET compare PUF circuits are that these circuits are application dependent and not flexible with changing field conditions.

Method used

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  • Implementing screening for single fet compare of physically unclonable function (PUF)
  • Implementing screening for single fet compare of physically unclonable function (PUF)
  • Implementing screening for single fet compare of physically unclonable function (PUF)

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Embodiment Construction

[0017]In the following detailed description of embodiments of the invention, reference is made to the accompanying drawings, which illustrate example embodiments by which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the invention.

[0018]The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises” and / or “comprising,” when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or gr...

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Abstract

A screening method and circuit for implementing a Physically Unclonable Function (PUF), and a design structure on which the subject circuit resides are provided. A plurality of field effect transistors (FETs) is coupled to a low-offset dynamic comparator and is respectively selected to provide a plurality of FET pairs. For each FET pair, a voltage offset to obtain a comparator output transition is identified and recorded. The recorded voltage offset for each FET pair is compared with a margin threshold value. Each FET pair having an identified voltage offset less than the margin threshold value is discarded or disabled for PUF response generation use.

Description

FIELD OF THE INVENTION[0001]The present invention relates generally to the data processing field, and more particularly, relates to a method and circuit for implementing screening for single field effect transistor (FET) compare of Physically Unclonable Function (PUF) utilizing a low-offset dynamic comparator, and a design structure on which the subject circuit resides.DESCRIPTION OF THE RELATED ART[0002]A physical unclonable function (PUF) is a function that is embodied in a physical structure and must be easy to make but practically impossible to duplicate, even given the exact manufacturing process that produced it. In this respect physical unclonable functions (PUFs), which are the hardware analog of a one-way function, or essentially random functions bound to a physical device in such a way that it is computationally and physically infeasible to predict the output of the function without actually evaluating it using the physical device.[0003]A physically unclonable function (PU...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H03K19/00G06F17/50
CPCG06F7/588H04L9/3278
Inventor FICKE, JOEL T.KESSELRING, GRANT P.STROM, JAMES D.
Owner MARVELL ASIA PTE LTD
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