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Circuit for trimming locking of integrated circuits

A technology of integrated circuits and locking circuits, applied in heating/cooling contact switches, etc., which can solve problems such as complexity, large chip area, consumption, etc.

Active Publication Date: 2008-11-26
O2MICRO CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, this method will be complicated and will consume a large chip area
In addition, this blown fuse based locking procedure will only be applicable to cavity packages, that is, typical plastic packages cannot use this locking method

Method used

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  • Circuit for trimming locking of integrated circuits
  • Circuit for trimming locking of integrated circuits
  • Circuit for trimming locking of integrated circuits

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Embodiment Construction

[0016] The content of the present invention will be described below with reference to FIGS. 3 , 4 and 5 , which depict main modules of an exemplary embodiment of the present invention. Calibration locking methods and circuits are described in terms of two IC types: single supply voltage ICs (Figures 4 and 5), and two or more supply voltage ICs (Figures 3 and 5). Broadly speaking, the present invention provides a lockout calibration circuit comprising a metal fuse interposed between a power supply line and a programmable fuse array (polysilicon fuse or zener diode). This metal fuse is chosen to maintain the current required to blow the polysilicon fuse or Zener diode. It is also an object of the present invention to use a circuit structure such that the metal fuse is blown. Once the metal fuse is blown, the power transfer to the array of programmable fuses (polysilicon fuse or Zener diode) is limited, so that the possibility of parasitic blowing of a fuse is substantially redu...

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PUM

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Abstract

A trimming locking circuit is provided for IC using a programmable fuse array for after-assembly trimming procedures. In one embodiment, a trimming locking circuit is provided for a single power supply input into the programmable fuse array. In another embodiment, a trimming locking circuit is provided to operate with two or more power supply inputs. The trimming locking circuit electrically isolates the programmable fuse array from over voltage conditions on the power supplies.

Description

technical field [0001] The invention relates to a post-package calibration lock circuit and method for integrated circuits, in particular to a post-package calibration lock circuit and method for power management integrated circuits. Background technique [0002] Conventional post-package IC calibration procedures typically end with a lock-out step that disconnects the calibration block from the package component pins, frees those pins for other functions, and enables The calibration block is permanently invalid. The post-package calibration process allows the IC to have a stable parameter that cannot be accidentally modified. Conventional IC calibration circuits are shown in Figure 1 and Figure 2. Figure 1 shows an IC with a single supply voltage pin A(VCC)5, while Figure 2 shows an IC with two supply voltages, pin A(VCC)5 and pin B(LVCC) ) 6 ICs. The power required to change the state of the fuse is provided by the VCC_calibration node 8, which can be connected to eith...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01H37/76
Inventor 玛利安·乌德瑞·斯班内康斯坦丁·布克玛利安·尼古拉乔治·斯密恩法瑞尔·玛瑞纳斯科
Owner O2MICRO CHINA