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Method for X ray detection adopting multi-element exposure parameter formula

A technology of exposure parameters and X-rays, which is applied in the field of exposure, can solve the problems that empirical formulas cannot meet the conditions, change the X-ray exposure, etc.

Active Publication Date: 2008-12-03
ELECTRIC POWER RESEARCH INSTITUTE OF STATE GRID SHANDONG ELECTRIC POWER COMPANY +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0038] The purpose of the present invention is to solve the current problem that the empirical formula cannot meet the needs of changing conditions when exposing X-rays, and cannot accurately and timely measure the X-ray exposure on the spot. It provides a method that is simple and easy to use. Machine voltage to obtain the required blackness, so as to quickly and accurately use the multi-exposure parameter formula for X-ray detection

Method used

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  • Method for X ray detection adopting multi-element exposure parameter formula
  • Method for X ray detection adopting multi-element exposure parameter formula
  • Method for X ray detection adopting multi-element exposure parameter formula

Examples

Experimental program
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Effect test

Embodiment 1

[0095] For a new ray machine, it must be "trained" according to the requirements of the instrument manual before use. At the end of the "training", a wall thickness T 1 For a plate of 10mm to 12mm, set the "transillumination current I 1 " = tube rated current, "exposure time t 1 " = 1 minute, "focal length f 1 "=600mm and "tube voltage V 1 " = 120kV This set of parameters is transilluminated; and then a plate with a thickness of T 2 = 36 ~ 40mm (or overlap several plates), and then set the "transillumination current I 2 " = tube rated current, "exposure time t 2 " = 2 minutes, "focal length f 2 "=600mm and "Tube voltage"=(80%~100%) the highest tube voltage; then transilluminate the latter group of plates according to this set of parameters.

[0096] The thickness of the transilluminated plate is T 1 and T 2 Test the blackness of the negative film, and record the blackness values ​​as D 1 and D 2 , and other conditions remain unchanged, then according to the measured ...

example 2

[0106] Example 2: For the reference exposure curve of a certain Dandong X3005 series machine, see figure 1

[0107] Take the value corresponding to the two red dots with the larger span of the two plate thickness ranges;

[0108] Select two red dots as the initial exposure point and its parameters are shown in Table 3:

[0109] Table three

[0110] plate thickness

mm

focal length mm

Tube current

(mA)

when exposed

Between (minutes

bell)

Tube voltage

kV

theoretical calculation

Voltage kV

ΔV

20

600

5

2

200

123.7

76.3

40

600

5

3.7

270

179.9

90.1

[0111] Substituting the values ​​in Table 3 into the formula (1) can be obtained respectively

[0112] V 1 ’=123.7kV; ΔV 1 =76.3kV;

[0113] V 2 ’=179.9kV; ΔV 2 =90.1kV

[0114] ΔV 1 and ΔV 2 Substituting them into formula (2) resp...

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Abstract

The invention discloses a method for testing X-rays through adopting multi-element exposing parameter formulas. Needing darkness can be obtained through adjusting an X-ray machine voltage, and thereby the X- ray can be exposed rapidly and accurately. The invention comprises firstly, taking at least two work pieces whose thickness are T1 and T2 respectively, meanwhile, T1is not equal to T2, secondly, setting corresponding transillumination current as I1, setting exposing time as t1, setting focal length as f1, and setting tube voltage as V2 for the x-ray machine respectively according to the two work pieces, thirdly, aligning the X-ray machine to the central portions of the work pieces according to two groups of parameters, the central portions of the work pieces are illuminated by main X-ray respectively, corresponding negative films with thickness of T1and T2 respectively which are produced through transillumination with the central portions of the work pieces, testing the darkness with a density meter, and recording darkness values as D1and D2 respectively, taking actual measured darkness D1 and D2 into the formula to calculate corresponding voltage V1'value and V2'value without changing other conditions, fourthly, implanting the formula into a controlling chip of a controlling box in the X-ray machine, and automatic explosion can be finished by the X-ray machine.

Description

technical field [0001] The invention relates to an exposure method, in particular to a method for X-ray detection by using multivariate exposure parameter formulas. Background technique [0002] The main purpose of industrial ray inspection is to detect whether there are defects in the workpiece. When a workpiece is transilluminated with X-rays, after the ray passes through the workpiece, it will attenuate and leave a latent image on the X-ray film behind the workpiece. For X-ray film, if the workpieces are of equal thickness, the blackness of the entire X-ray film is also uniform, but if the thickness of the workpiece is not equal, the blackness of the X-ray film will be poor. When there is a defect in the workpiece When there is a difference in the thickness of the workpiece due to the difference between the material of the defect and the workpiece, there must be a difference in blackness on the X-ray film. The inspector will judge whether it is a defect based on the diff...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/18G03B42/02G06F19/00
Inventor 肖世荣张丙法李正利
Owner ELECTRIC POWER RESEARCH INSTITUTE OF STATE GRID SHANDONG ELECTRIC POWER COMPANY
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