Integrated RF signal level detector usable for automatic power level control

Abstract

The radio frequency signal voltage is determined from an AC reference voltage generated from a DC reference voltage and the envelope of the AC reference voltage is determined in an envelope detector, wherein the envelope detector (130) has a function substantially equivalent to that used to determine the radio frequency signal envelope The structure of the envelope detector (150). This AC reference voltage substantially cancels any DC offset, resulting in high stability against temperature and power supply variations. Furthermore, using approximately the same RF signal path for the RF signal and the reference signal can substantially compensate signal distortion caused by the RF signal path.

Description

Technical field [0001] The present invention mainly relates to an automated method for measuring radio frequency (RF) signals emitted by a transmitter, such as those used in wireless communication systems, such as wireless local area networks (WLAN), mobile phones, etc., and Specifically, the present invention relates to an on-chip detection system for RF signals to be easily implemented in an integrated automatic power level control system. Background technique [0002] As the demand for two-way wireless communication systems has been continuously increasing, no effort has been spared to develop low-cost and highly reliable transmitter / receiver devices (hereinafter referred to as transceivers). The key issue in this regard is the degree of integration of the corresponding transceivers that can be manufactured. In addition, in many applications, such as mobile phones, mobile computer applications, etc., low power consumption for long operating times with limited battery power is ...

AI Technical Summary

Problems solved by technology

[0008] In order to provide for example precise and reliable control of the transmit output power of a transceiver device, it is additionally necessary to compare the signal obtained by the envelope detector with a suitably selected reference signal to obtain a control signal, however, where not only the detector Internal changes, as well as changes in the generation and processing of the reference signal, will lead to unstable conditions in the corresponding control loop

Specifically, die temperature effects, power supply fluctuations, and manufacturing process variations can greatly degrade the performance of on-chip detection of absolute RF signal power levels and their comparison to predefined reference signals

Images