Write-once-read-many optical recording medium
An optical recording medium, multiple reading technology, applied to optical record carriers, optical recording/reproducing, data recording, etc., can solve problems such as the applicability of optical recording medium is not mentioned
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Embodiment 1
[0186] Such as Figure 16 As shown, by sputtering, a recording layer 12, an overcoat layer 13, a reflective layer 14, and a UV-curable resin-containing resin were sequentially formed on a polycarbonate substrate 11 having a guide groove (not shown) with a depth of 20 nm to a thickness of The protective layer 15 is about 5 μm, so as to prepare the write-once-read-many optical recording medium 10 .
[0187] The recording layer contains Bi 2 o 3 And the thickness is 10nm. Top coat contains ZnS and SiO 2 (ZnS and SiO 2 The molar ratio is 80:20) and the thickness is 17nm. The reflective layer contained an Ag alloy (AgIn in which the composition of In was about 0.5% by mass) and had a thickness of 100 nm.
[0188] Using a disc detector DDU-1000 manufactured by Pulstec Industrial Co., Ltd., with a wavelength of 405 nm, a numerical aperture of 0.65, and a beam diameter of about 0.55 m, using a laser intensity at the center of the beam diameter of 1 / e 2 ; According to the multi-...
Embodiment 2
[0195] Such as Figure 16 As shown, by sputtering, a recording layer 12, an overcoat layer 13, a reflective layer 14, and a UV-curable resin with a thickness of The protective layer 15 is about 5m long, so as to prepare the write-once-read-many optical recording medium 10 .
[0196] More specifically, using Bi 2 o 3 and a recording layer having a thickness of 10 nm, a reflective layer containing an Ag alloy (AgBi, wherein the composition of Bi is about 0.5% by mass) having a thickness of 100 nm, and containing ZnS and SiO 2 (ZnS and SiO 2 The molar ratio is 80:20) and the overcoat layer with various thicknesses is used to prepare a write-once-read-many optical recording medium.
[0197] The reflectance and jitter of these optical recording media were measured using a disc tester DDU-1000 manufactured by Pulstec Industrial Co., Ltd. at a wavelength of 405 nm and a numerical aperture of 0.65.
[0198] Such as Figure 17 As shown, suitable SDRs are observed when the thickne...
Embodiment 3
[0203] Such as Figure 16 As shown, by sputtering, a recording layer 12, an overcoat layer 13, a reflective layer 14, and a UV-curable resin are sequentially formed on a polycarbonate substrate 11 having a guide groove (not shown) with a depth of 22 nm and a thickness of The protective layer 15 is about 5 μm, so as to prepare the write-once-read-many optical recording medium 10 .
[0204] More specifically, using ZnS and SiO 2 (ZnS and SiO 2 The molar ratio of 80:20) and the upper coating layer with a fixed thickness of 15 nm, the reflective layer containing an Ag alloy (AgBi, wherein the composition of Bi is about 0.5% by mass) and a fixed thickness of 100 nm, and the layer containing Bi 2 o 3 And it has recording layers of various thicknesses to prepare an optical recording medium for writing once and reading many times.
[0205] The reflectance and SDR of these optical recording media were measured with a disc tester DDU-1000 manufactured by Pulstec Industrial Co., Ltd....
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