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Signal test system

A technology for signal testing and testing systems, applied in transmission systems, transmission monitoring, electrical components, etc., to solve problems such as inconvenience, non-simultaneous, and low interception rates

Inactive Publication Date: 2010-03-17
ARCADYAN
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  • Description
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  • Application Information

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Problems solved by technology

[0003] At present, the test can only provide a single signal analysis device and a single signal generation device, which is inconvenient for product batch (Batch), receiver interference immunity (Interference Immunity), receiver intermodulation distortion (Intermodulation Distortion), transmitter noise suppression (Spur Inhibition) ), transmitter harmonic suppression (Harmonics Suppression), multi-station (Multiple-Station) or dense electromagnetic (DenseElectromagnetic) environment, etc.
Traditional signal analyzers adopt Scanned superheterodyne receiver technology, which can only support Non-simultaneous, Low Probability of Intercept, and Slow Speed ​​applications
Moreover, the traditional signal generator adopts Swept tuned transmitter technology, which can only support non-simultaneous, low-density signal simulation, and slow speed applications.

Method used

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Embodiment Construction

[0017] see figure 1 Shown is a schematic diagram of a signal test system provided with a preferred embodiment of the present invention. The signal testing system 10 includes multiplexers 101 , 103 , circulators 105 , 107 , channel emulators 109 , 111 , power splitters 113 , 115 , signal analyzing device 130 , and signal generating device 110 . Wherein, when the accompanying objects 181-185 (a total of M) are transmitting terminals (Tx), they can pass through the test path 1 (shown by a dotted line), that is, through the multiplexer 101, the circulator 105, the channel emulator 109, The power divider 113, the circulator 107, and the multiplexer 103 provide a simulated wireless transmission path, so that the output signals of the objects under test 181-185 are transmitted to the UUT as the receiving end (Rx) via the wireless transmission path. Objects 151-155 (N in total).

[0018] Alternatively, when the DUTs 151-155 are transmitters, they can pass through the test path 2 (in...

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Abstract

Through configuration of circulator and multiplexer, the signal test system can provide bidirectional wireless transmission test for accompanied test object and object to be tested. Besides bidirectional peer-to-peer measurement, the testing system picks up signal in testing path through power divider. Also, using signal analysis device carries out testing in order to reach multi analysis. Throughsignal generator, the testing system generates signals in use for accompanied test or verification in order to reach multivariated test items. In the invention, signal switch device is setup inside signal analysis device, and signal generation device. Through the signal switch device, the signal analysis device carries out analysis for signals in different frequency bands as well as generates impulse signals in different frequency bands according to need of test system.

Description

technical field [0001] The invention relates to a signal test system, in particular to a test system capable of multiple bidirectional tests between an object to be tested and an object to be tested. Background technique [0002] With the progress of wireless technology, the development of wireless products is more and more vigorous, such as wireless network cards, or wireless base stations. Especially in the manufacturing process, testing is often an important part, which can affect the production cost and the quality of the manufactured products. [0003] At present, the test can only provide a single signal analysis device and a single signal generation device, which is inconvenient for product batch (Batch), receiver interference immunity (Interference Immunity), receiver intermodulation distortion (Intermodulation Distortion), transmitter noise suppression (Spur Inhibition) ), transmitter harmonic suppression (Harmonics Suppression), multi-station (Multiple-Station) or...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00H04B17/309
Inventor 刘一如
Owner ARCADYAN
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