Testing storage system electronics using loopback

Abstract

A system includes a hard disk controller (HDC) module that controls a hard disk and a read channel (RC) device that communicates with the HDC module via a read bus and a write bus. The RC device includes a loopback circuit that selectively loops back the write bus to the read bus. The RC device generates a write clock for the HDC module to write data on the write bus and a read clock for the HDC module to read the data on the read bus, wherein the write clock is independent of the read clock.

Description

technical field [0001] The present invention relates to storage systems, and more particularly, to testing electronics and subsystems in storage systems. Background technique [0002] The background description provided here is for the purpose of generally presenting the context of the invention. The work of the presently named inventors is neither expressly nor impliedly admitted to be prior art to the present invention to the extent described in the Background section and to the extent described in the Background section and which at the time of filing the application may not have been described as prior art . [0003] Host devices such as computers, laptops, servers typically store data on storage devices such as hard drives. now refer to figure 1 , an exemplary hard disk drive 10 is shown including a hard disk drive (HDD) system 12 and a hard drive assembly (HDA) 13 . HDA 13 includes one or more circular recording surfaces 14 . The recording surface 14 is covered wi...

AI Technical Summary

Problems solved by technology

Therefore, traditional test equipment may not be able to test complex devices and subsystems in high-speed compact disk drives, such as read channel devices, hard disk controllers, etc.

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