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Test prepared integrated circuit with an internal power supply domain and test method

A technology of integrated circuits and internal power supplies, applied in the direction of measuring current/voltage, measuring electricity, measuring devices, etc.

Inactive Publication Date: 2011-08-31
NXP BV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This patent application does not address the testing of integrated circuits with multiple power domains

Method used

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  • Test prepared integrated circuit with an internal power supply domain and test method
  • Test prepared integrated circuit with an internal power supply domain and test method
  • Test prepared integrated circuit with an internal power supply domain and test method

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Embodiment Construction

[0021] figure 1 An integrated circuit 10 is schematically shown having: power supply connections Vss, Vss'; a plurality of logic circuit blocks 12; a supply voltage adaptation circuit 14; an integrating analog-to-digital conversion circuit 16; a voltage selection circuit 18; Register 19. The supply voltage adaptation circuit 14 is connected to the supply connections Vss, Vss'. The integrated circuit comprises internal power supply conductors 13 which are connected from respective supply voltage adaptation circuits 14 to the power supply terminals of corresponding logic circuit blocks 12 . Logic block 12 may include combinational logic circuits as well as memory elements.

[0022] The input of the integrating analog-to-digital conversion circuit 16 is connected to the respective internal power supply conductor 13 and the output is connected to the scan register 19 . The scan record is switched into a shift register chain for outputting data from the integrating analog-to-dig...

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Abstract

The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal power supply voltage is supplied to a temporally integrating analog to digital conversion circuit (16) in the integrating circuit (10). A temporally integrated value of the power supply voltage is measured during a measurement period. Preferably, integrating measurements of a plurality of internal supply voltages are performed in parallel during the same measurement time interval. Preferably a further test is performed by changing over between mutually different supply voltages during a further measurement period. In this way the measured integrated supply voltage can be used to check the speed of the change over between the different voltages.

Description

technical field [0001] The present invention relates to an integrated circuit including an internal power supply domain and testing of such an integrated circuit. Background technique [0002] In an article entitled "An Autonomous Decentralized Low-Power System with Adaptive-Universal Control for a Chip MuItiProcessor" published in the Digest of technical Papers of the 2003 IEEEInternational Solid-State Circuits Conference, San Francisco, pages 109-109, Masayuki Miyazaki describe integrated circuits with multiple power domains. [0003] Masayuki Miyazaki et al describe how to use multiple power domains to reduce the power consumption of integrated circuits. The functional circuits of the integrated circuit are divided into modules. Each has its own regulated power supply circuit to control the supply voltage and body bias voltage for the circuits in that module. In operation, these voltages are dynamically adjusted for each module depending on the clock frequency necessar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3185G01R19/165
CPCG01R31/31721G01R31/318533
Inventor 伦泽·I·M·P·迈耶桑迪普库马尔·戈埃尔何塞德耶鲧·皮内达德干维兹
Owner NXP BV