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Pipeline test apparatus and method

A technology of testing equipment and testing methods, which is applied in the directions of electronic circuit testing, semiconductor/solid-state device testing/measurement, and electrical measurement, and can solve problems such as high cost and increased testing cost

Inactive Publication Date: 2008-11-12
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the cost of testing increases due to the high cost of test equipment with so many different test functions

Method used

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  • Pipeline test apparatus and method
  • Pipeline test apparatus and method
  • Pipeline test apparatus and method

Examples

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Embodiment Construction

[0022] Hereinafter, the present invention will be described by explaining exemplary embodiments of the invention in detail with reference to the accompanying drawings. The same reference numerals in the figures denote the same elements.

[0023] Figure 2A and 2B is a diagram illustrating a pipeline testing method according to an exemplary embodiment of the present invention. refer to Figure 2A , a plurality of sockets 221 , 222 and 223 are mounted on the test board 210 . Each socket 221, 222, and 223 may perform a different type of test, such as an open / short (O / S) test, a design for testability (DFT) test, or a simulation test. The sockets 221 , 222 and 223 may be arranged on the test board 210 in a row or in a column. The sockets 221, 222, and 223 may be equally spaced apart from each other. When a device under test (DUT) is mounted in each of the sockets 221, 222, and 223, only the corresponding test item is performed.

[0024] refer to Figure 2B , the pipeline t...

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PUM

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Abstract

A pipeline test apparatus is provided. The pipeline test apparatus includes a test board. A plurality of stages of sockets are installed on the test board. Each socket is configured to be connected to a device under test (DUT). The sockets of each stage are connected to one of a plurality of different testing devices. Each testing device is configured to perform a unique test on all the DUTs of a corresponding stage.

Description

[0001] cross reference [0002] This application claims priority from Korean Patent Application No. 10-2007-0045096 filed with the Korean Patent Office on May 9, 2007, the entire disclosure of which is hereby incorporated by reference. technical field [0003] The present disclosure relates to methods and apparatus for testing semiconductors, and more particularly to methods and apparatus for testing semiconductors by utilizing a pipeline approach. Background technique [0004] With the increased integration and production of semiconductor devices, there is an increased need for test equipment that can test semiconductor devices in large quantities. [0005] However, there is a limit to the number of channels that can be used in test equipment. The number of channels corresponds to the number of signals of the semiconductor device. The number of chips that can be tested at one time is limited by the number of channels available. Each channel can perform various types of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/3183G01R31/02G01R1/073G01R31/01
CPCG01R31/01G01R31/2886G01R1/07307G01R31/2893G01R31/28H01L22/00
Inventor 郑镇国
Owner SAMSUNG ELECTRONICS CO LTD