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Method and system for circuit detection

A technology for inspecting circuits and circuits, applied in the direction of electronic circuit testing, measuring electricity, measuring electrical variables, etc., can solve problems such as complex and expensive inspection systems, slowing down the inspection process, etc.

Inactive Publication Date: 2012-05-16
CAMTEK LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In many inspection systems, the operator is required to manually load and unload the circuits, thereby significantly slowing down the inspection process
On the other hand, fully automated inspection systems are complex and very expensive

Method used

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  • Method and system for circuit detection
  • Method and system for circuit detection
  • Method and system for circuit detection

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Embodiment Construction

[0015] According to various embodiments of the present invention, a system is provided. The system comprises a set of devices adapted to load objects such as circuits and to unload objects of the inspection. This group of equipment includes inspection tables for scanning systems. The inspection system is conveniently included in the system.

[0016] The following description refers to a multi-object conveyor that performs linear motion along a first axis. It may be noted that, according to another embodiment of the invention, the multi-object conveyor can move along multiple axes and can perform non-linear movements. The multi-object conveyor can move, for example, along an imaginary x-axis and an imaginary y-axis. Such movement may provide unwanted y-axis movement of the first and / or third surface.

[0017] The principles and operation of the set of devices may be better understood with reference to the drawings and accompanying descriptions.

[0018] attached figure 1...

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Abstract

The invention discloses a check circuit method and a system. The system comprises a first surface, a second surface, a third surface and a multiple goal conveyor, wherein the multiple goal conveyor is suitable for grasping a pretest circuit on the first surface and a precedence detection circuit on the second surface, and simultaneously conveying the pretest circuit to the second surface and conveying the precedence detection circuit to a third surface. The system is suitable for detecting the circuit on the second surface.

Description

[0001] related application [0002] This application claims priority to US Provisional Patent Serial No. 60 / 749,052 filed December 17, 2005. technical field [0003] The present invention relates to the field of systems and methods for inspecting electrical circuits. Background technique [0004] Circuits such as printed circuit boards and chips are manufactured through very complex manufacturing processes. During these manufacturing processes different types of defects occur and the circuits are typically inspected and even go through an inspection process in order to guarantee their quality. [0005] The inspection process typically includes loading the circuit into the inspection system, inspecting the circuit, and then unloading the circuit from the inspection system. [0006] In many inspection systems, an operator is required to manually load and unload circuits, thereby slowing down the inspection process significantly. On the other hand, fully automated inspection...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/00
Inventor 埃维·列维拉菲·阿米特
Owner CAMTEK LTD
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