Method and apparatus for testing error rate based on high speed serial interface encoded mode

Abstract

The invention discloses a method for testing code error rate based on a high-speed serial interface coding mode and relates to code error rate testing technology which is provided for solving the problems that the prior code error rate testing mode can not properly test the bit error rate of a signal channel and is complex. The method comprises the following technical proposal: in decoding, the number of code sets which do not meet a coding rule is counted; and the total quantity of transmitted data is calculated so as to determine the code error rate. The invention simultaneously discloses a device for realizing the method. The method does not need to mount an external code error testing instrument; the calculated code error rate is real-time code error rate of the signal channel and directly reflects the transmission quality of the signal channel; and the tested code error rate has high reference value.

Description

technical field [0001] The present invention relates to a bit error rate testing technology, more precisely to a bit error rate testing method and device based on a high-speed serial interface coding mode. Background technique [0002] As the demand for information flow continues to grow, the traditional parallel interface technology has become a bottleneck to further increase the data transmission rate. Serial communication technology is replacing the traditional parallel bus and becoming the mainstream of high-speed interface technology. [0003] The high-speed serial interface adopts differential signal transmission instead of single-ended signal transmission, thereby enhancing the anti-noise and anti-interference ability, and adopts clock and data recovery technology instead of transmitting data and clock at the same time, thereby solving the signal clock offset problem that limits the data transmission rate . Therefore, the application of high-speed serial interfaces ...

AI Technical Summary

Problems solved by technology

[0006] Existing test methods need to use an external device-a bit error tester to test the bit error rate. When the distance of the channel to be tested is long enough, it will become very difficult to connect the test interface of the bit error tester to the interface of the channel to be tested. Difficult, basically impossible to test

In addition, the above test method can only be used to test the channel bit error rate through PRBS, which cannot be tested with the real-time channel quality and real-time bit error rate of the channel to be tested, and the reference value of the tested bit error rate is limited

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