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Method for scanning flash memory medium

A scanning method and medium technology, applied in the direction of information storage, static memory, read-only memory, etc., can solve problems such as low efficiency and discomfort, low accuracy and reliability of scanning results, and inability to comprehensively find out bad blocks, etc., to achieve fast The effect of accurate scanning

Active Publication Date: 2014-04-30
NETAK TECH KO LTD
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  • Application Information

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Problems solved by technology

Using the above-mentioned scanning technology can completely and accurately complete the scanning, but it usually takes half an hour or even longer to scan a piece of flash memory media with a large capacity such as 1G, and the speed is slow and the efficiency is low, which is not suitable for actual production applications; the above-mentioned scanning technology can be used alone Run several scans, generate the scan results separately and then integrate them to form the final scan result. For the case of many bad blocks, the bad blocks will be scanned multiple times
There is another scanning technology that can improve the scanning speed, but it cannot find bad blocks comprehensively, and the accuracy and reliability of the scanning results are not strong

Method used

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  • Method for scanning flash memory medium
  • Method for scanning flash memory medium
  • Method for scanning flash memory medium

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no. 1 example

[0020] Such as figure 2 As shown, the scanning process of the first embodiment includes:

[0021] Step S1, performing an erasing scan on the flash memory medium to generate an erasing scan result;

[0022] Step S2, scanning the flash memory medium for at least one scanning cycle, and generating scanning results for at least one cycle respectively;

[0023] Step S3, integrating the erasing scan results and / or the scan results of at least one cycle to form a final scan result.

[0024] The above-mentioned erasure scanning refers to the process of checking whether part or all of the data is erased correctly after erasing the flash memory medium, and finding bad blocks accordingly. The above scanning cycle refers to a process of scanning and checking the flash memory medium to find bad blocks. The cycle scan result is the bad block information found through a scan cycle. The final scan result refers to the good / bad block information of the flash memory medium formed by integr...

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Abstract

The invention provides a method for scanning a flash memory medium, which comprises the following steps of: performing the erasing and scanning of the flash memory medium and generating erasing and scanning results; scanning the flash memory medium for at least one scanning cycle and generating results of scanning of at least one cycle respectively; and integrating the erasing and scanning results and / or the results of the scanning of the at least one cycle to form final scanning results. The method for scanning the flash memory medium can scan the flash memory medium quickly and accurately, find out bad blocks and get rid of the bad blocks in a short time, is not used in the following conventional scanning process, greatly improves the scanning speed and retains the comprehensiveness of the conventional scanning process.

Description

technical field [0001] The invention relates to the field of semiconductor storage media, in particular to a method for scanning flash memory media. Background technique [0002] Flash media (Flash) includes multiple storage blocks (Block, the basic unit of erasing flash media), each block includes multiple pages (Page, the basic unit of reading and writing flash media), and each page includes multiple bits (bit, the value is 0 or 1). Bits that can achieve inverse conversion from 0 to 1 and from 1 to 0 are called good bits, otherwise they are considered bad bits and cannot be used to store data. To identify whether flash media is usable, the blocks within it are scanned. An existing flash media scanning process is as follows: figure 1 As shown, the way to judge whether a certain block is a good block is to erase a certain block, then write data to this block, and then read data from each page, and compare it with the written data. When the data written and read out in a ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/14G11C16/06
Inventor 卢赛文
Owner NETAK TECH KO LTD
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