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Test status recognition device and method for iron loss tester

A technology of test status and identification method, which is applied in the direction of measuring devices, instruments, measuring electricity, etc., can solve the problems of iron loss tester not working normally, primary coil damage, etc., and achieve the effect of improving the service life and test quality

Inactive Publication Date: 2012-05-23
ZHEJIANG UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] In the prior art, when the iron loss tester is used to test the iron loss of the silicon steel sheet sample, the test of the iron loss value is mainly realized through the electrical connection between the primary coil in the test probe and the silicon steel sheet sample. When the test probe of the loss tester is separated from the silicon steel sheet sample and is in a working state for a long time, the primary coil inside the test probe is easily damaged due to excessive current, which will cause the iron loss tester to fail to work normally.

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  • Test status recognition device and method for iron loss tester
  • Test status recognition device and method for iron loss tester
  • Test status recognition device and method for iron loss tester

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Embodiment Construction

[0009] refer to figure 1 : the present invention comprises microcontroller 8, digital-to-analog converter 6, analog-to-digital converter 7, test probe 1, power amplifying circuit 3 and sampling resistor 4, and described microcontroller 8 is connected with digital-to-analog converter 6, analog-to-digital converter respectively The converter 7 is connected, the test probe 1 includes a primary coil 2, the primary coil 2 is connected in series between the power amplifier 3 and the sampling resistor 4, and the digital-to-analog converter 6 is connected in series between the microcontroller 8 and the power Between the amplifiers 3, the analog-to-digital converter 7 is connected in series between the microcontroller 8 and the sampling resistor 4, and the other end of the sampling resistor 4 is connected to the analog ground 5; the microcontroller 8, the digital-to-analog converter 6. The analog-to-digital converter 7, the test probe 1, and the power amplifier circuit 3 are all purcha...

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Abstract

The invention relates to the technical field of silicon steel sheet iron core loss measurement, in particular to a device and method for the iron loss tester to recognize whether a test probe is separated from silicon steel sheet samples. The recognition device comprises a microcontroller, a digital to analog converter, an analog to digital converter, the test probe, a power amplifying circuit and a sampling resistor, and is characterized in that: the microcontroller is connected with the digital to analog converter and the analog to digital converter respectively; the test probe comprises a primary coil which is serially connected between a power amplifier and the sampling resistor; the digital to analog converter is serially connected between the microcontroller and the power amplifier;the analog to digital converter is serially connected between the microcontroller and the sampling resistor; the other end of the sampling resistor is grounded; and the working procedure of the microcontroller 8 adopts C language programming. Under the control of the working procedure of the microcontroller, whether the test probe is separated from the silicon steel sheet samples can be automatically recognized. Therefore, the use period and test quality of the test probe are improved.

Description

technical field [0001] The invention relates to the technical field of silicon steel sheet core loss measurement, in particular to an identification device and an identification method for an iron loss tester to identify whether a test probe is detached from a silicon steel sheet sample. Background technique [0002] In the prior art, when the iron loss tester is used to test the iron loss of the silicon steel sheet sample, the test of the iron loss value is mainly realized through the electrical connection between the primary coil in the test probe and the silicon steel sheet sample. When the test probe of the loss tester is separated from the silicon steel sheet sample and is in a working state for a long time, the primary coil inside the test probe is easily damaged due to excessive current, which will cause the iron loss tester to fail to work normally. Contents of the invention [0003] The object of the present invention is to provide a kind of identification device ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R21/08
Inventor 顾伟驷苏英俩余佩琼杭亮
Owner ZHEJIANG UNIV OF TECH