Automatic test system and operating method and instrument control device thereof

Abstract

The invention provides an automatic test system and an operating method and an instrument control device thereof. The automatic test system comprises a plurality of instruments and the instrument control device, wherein the instrument control device is used for controlling the plurality of instruments to test an object to be tested respectively, and displays an operating screen with a plurality of operating units; the plurality of operating units correspond to different functions or operating states of the plurality of instruments respectively; and in a specified time interval, the instrumentcontrol device records at least one operating step performed by a user on the operating screen, and produces a log file according to the operating step. Due to a more humanized operating interface provided by the invention, the user only actually performs process steps of various tests, the instrument control device can simultaneously record operating processes and automatically convert the operating processes into a test command set necessary for performing the automatic test system, so that a large amount of time and energy formerly consumed when the operating staff compiles the test command set is largely reduced.

Description

technical field [0001] The present invention is related to automatic testing, and in particular, relates to an automatic testing system, an instrument control device and an operating method thereof capable of providing a humanized operation interface to simplify the writing difficulty of a testing command set. Background technique [0002] In recent years, with the continuous development of science and technology, all kinds of electronic devices need to go through relevant testing procedures in the research and development stage or before the manufactured products are ready to leave the factory, so as to ensure that the electronic products can meet the requirements of safety regulations and product specifications. [0003] Generally speaking, in the automatic test system currently on the market, the design methods of the man-machine interface for writing the test command set are nothing more than the following two methods. The first way is: the human-machine interface of the...

AI Technical Summary

Problems solved by technology

The biggest disadvantage of this method is: the operator must memorize the name of each test command, and need to abide by the writing format defined by the automatic test system. Therefore, this method is not only difficult to execute, but also requires considerable professionalism and proficiency. Operators can only be competent, and it takes a very long time

[0005] However, as the functions of electronic products become more and more complex, more and more functional items need to be tested. Taking the automatic test system of switching power supply as an example, the length of the control command corresponding to a single functional test item There are often hundreds or even thousands of columns. As for the control command set required for the entire switching power supply test, the content of the control command set is even greater. Even through the "click" method, it is quite time-consuming and seriously affects various electronic systems. Equipment R & D testing and product launch schedule

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