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Complex programmable logic device (CPLD) controller special for detecting defects of warp-knitted fabrics

A detection control system, knitted fabric technology, applied in the program control of sequence/logic controller, electrical program control, etc.

Inactive Publication Date: 2011-04-20
JIANGNAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after using digital image processing technology to complete the defect detection of warp knitted fabrics, there is no clear solution on how to identify the defects and perform preliminary processing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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  • Complex programmable logic device (CPLD) controller special for detecting defects of warp-knitted fabrics
  • Complex programmable logic device (CPLD) controller special for detecting defects of warp-knitted fabrics
  • Complex programmable logic device (CPLD) controller special for detecting defects of warp-knitted fabrics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] The whole warp knitted fabric defect detection controller is mainly composed of the CPLD system, and the warp knitted fabric defect detection processor is mainly composed of CPLD, storage body, communication interface and keyboard display, etc., which are used for receiving, storing and processing warp knitting during work Knitted fabric defect data, constitute a block diagram such as figure 2 Shown. When the warp knitted fabric defect data is changed, the system computer is used to input the defect data through the RS232 interface and store it in the warp knitted fabric defect processor.

[0017] The warp knitted fabric defect memory is used to store the defect data; the keyboard and display are used to input the warp knitted fabric structure parameters and other working parameters; the RS-232 serial communication interface receives the defect data transmitted from the upper computer; the CPLD system is responsible for the whole Operation control and data processing of d...

example 2

[0021] The whole warp knitted fabric defect detection controller is mainly composed of FLEX10k Altera CPLD system, and the fabric defect processor is mainly composed of FLEX10k Altera CPLD system, storage body, communication interface and keyboard display, etc., which are used for receiving, storing and processing fabric defects in the working process Data, composition diagram such as Figure 4 Shown. When the fabric defect data is changed, the processed fabric defect data is stored in the U disk, and the fabric defect data of the U disk is read into the memory of the fabric defect processor through the USB interface.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Abstract

The invention provides a complex programmable logic device (CPLD) controller special for detecting defects of warp-knitted fabrics, belonging to the field of novel textile machinery. The warp-knitted fabrics have the defects of wide varieties and complex detection algorithm, so the specific detect treatment flow is required to be selected according to the varieties and relevant characteristics of the defects during defect detection. By adopting simple single software treatment method, the real-time control requirement of defect detection can not be met obviously. In order to solve the technical problem, in the invention, a CPLD is taken as the core of a control system, and a CPLD system is used for reading the varieties and relevant characteristics of the defects and controlling the subsequent treatment flows of the defects of the warp-knitted fabrics so as to meet the real-time control requirement of defect detection treatment, thus completing the treatment flows of the defects of the warp-knitted fabrics.

Description

Technical field [0001] The present invention relates to the development of a special control system for detecting defects in warp knitted fabrics with a CPLD system as the core, and specifically relates to using the CPLD system to read the types of defects in warp knitted fabrics and related characteristic data and store the information in a memory, and use the data to control steps in real time. Into the motor action to achieve the control of the defect detection and processing mechanism to achieve the effect of real-time processing of defects. Background technique [0002] In the production process of warp knitted fabrics, due to yarn and weaving technology, defects such as slubs, missing warps, missing wefts, holes, and oil stains will be formed on the fabric surface. After the warp knitted fabric is produced, the computer digital image processing technology can be used to locate the fabric defect and extract the characteristic parameters of the fabric defect to classify the d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/04
Inventor 刘基宏潘如如王鸿博高卫东刘建立
Owner JIANGNAN UNIV