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Test sample bearing device

A technology for carrying devices and testing samples, which is applied in the direction of measuring devices, measuring device casings, electronic circuit testing, etc. It can solve the problems of easy bending deformation and damage of pins, and achieve the effect of avoiding bending deformation or even damage of pins

Inactive Publication Date: 2011-05-11
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a test sample carrying device to solve the problem that the pins of the test sample are prone to bending deformation or damage in the high and low temperature environment reliability test

Method used

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Embodiment Construction

[0017] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0018] A kind of test sample carrying device described in the present invention can utilize multiple alternative ways to realize, and the following is to illustrate by preferred embodiment, certainly the present invention is not limited to this specific embodiment, those of ordinary skill in the art Known general replacements are undoubtedly covered within the protection scope of the present invention.

[0019] Secondly, the present invention is described in detail using schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of illustration, the schematic diagrams are not partially enlarged according to the general scale, which should not be used as a limitation of the present inventi...

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PUM

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Abstract

The invention provides a test sample bearing device, which comprises a base, wherein the base is provided with a sample bearing chamber, and four sides of the sample bearing chamber are provided with partition fences protruded relative to the base; four sides in the sample bearing chamber are also provided with bearing fences protruded relative to the base, and the heights of the bearing fences are lower than the heights of the partition fences; and through holes are formed in the bearing fences. According to the test sample bearing device provided by the invention, a test sample is fixed through the partition fences and the bearing fences, and cold and hot high-speed converted airflow generated during testing does not cause movement or collision of the test sample so as to avoid pin bending deformation and even damage of the test sample.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a test sample carrying device for reliability testing in high and low temperature environments. Background technique [0002] Thermal shock test is an important environmental test item in product reliability testing. It tests the reliability of products by simulating the temperature changes that products need to withstand during the transportation process from packaging and testing plants to system customers. [0003] The cold and heat shock experiment provides a high and low temperature environment through the cold and heat shock equipment, please refer to Figure 1a and Figure 1b , Figure 1a and Figure 1b It is a schematic diagram of the working mode of the thermal shock equipment. Such as Figure 1a As shown, the sample 1 is placed in the test area 2 of the thermal shock equipment, the high-temperature chamber baffle 3 is opened, and the high-temperature airflow ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/02G01N3/60G01R1/04G01R31/28
Inventor 李刚郑鹏飞刘云海丁佳妮
Owner SEMICON MFG INT (SHANGHAI) CORP