Device for testing anti-interference capability index
A technology of interference signals and transformers, applied in digital transmission systems, error prevention, electrical components, etc., can solve problems such as the inability to test the anti-interference ability index of the tested signal, and the fixed attenuation of the synthesized signal, so as to reduce the realization model and improve the ease of use. practical effect
Active Publication Date: 2011-05-11
ZTE CORP
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Problems solved by technology
[0005] The present invention is proposed in view of the problem that the linear summation network does not consider impedance matching in the related art, resulting in a fixed attenuation of the synthesized signal, which makes it impossible to test the anti-interference ability index of the tested signal. Therefore, the main purpose of the present invention is to provide a test anti-interference capability The scheme of interference capability index to solve the above problems
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[0021] Functional Overview
[0022] Considering the problem in the related art that the linear addition network does not consider impedance matching, resulting in a fixed attenuation of the synthesized signal, which makes it impossible to test the anti-interference ability index of the signal under test, an embodiment of the present invention provides a device for testing the anti-interference ability index. The device includes: a linear addition network and an attenuation network, wherein the linear addition network includes: a transformer, the primary of the transformer is connected to the interference signal source, and the ratio of the turns of the transformer is based on the interference signal of the interference signal source after passing through the linear addition network The attenuation value that needs to be attenuated is determined; the resistor is connected in series between the test signal source and the attenuation network, and is connected in parallel with the ...
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The invention discloses a device for testing an anti-interference capability index. The device comprises a linear summarization network and an attenuation network, wherein the linear summarization network comprises a transformer and a resistor; the primary of the transformer is connected with an interference signal source; the ratio of the number of windings of the transformer is determined according to an attenuation value of an interference signal to be attenuated of the interference signal source after the interference signal passes through the linear summarization network; the resistor is connected in series between a test signal source and the attenuation network and connected in parallel with the secondary of the transformer; and the resistance value of the resistor is determined according to an impedance form of interface equipment. Due to the device for testing the anti-interference capability index, the implementation model of the test device is simplified, and the usability of the test device is enhanced.
Description
technical field [0001] The invention relates to the field of digital communication, in particular to a device for testing the anti-interference ability index. Background technique [0002] The anti-interference ability index of the input port is an important index of the interface equipment of the 2048Kbit / s series system and the 1544Kbit / s series system in the digital communication network. International and domestic communication industry standards, ITU-T standards, etc. have strictly defined and explained the anti-interference ability of the input port. E.g, figure 1 It is a block diagram of the input port anti-interference ability test specified in GB / T 7611 of the related technology, such as figure 1 As shown in the national standard "GB / T 7611 Digital Network Series Bit Rate Electrical Interface Characteristics", the E1 input port anti-interference ability test method is "linearly synthesize (add) the test signal and the interference signal through a linear addition ...
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IPC IPC(8): H04L1/00
Inventor 李德辉陈飞
Owner ZTE CORP