Polarization resolution differential reflection spectrum measuring system

Abstract

The invention discloses a polarization resolution differential reflection spectrum measuring system, comprising a liquid nitrogen Dewar, a manual three-dimensional translation stage, an achromatic lens, an exciter used for vibrating a lens periodically, a wide band quarter wave plate, a dual-output Gran-Taylor prism, a wide band linear polarizer and a wide band half wave plate, a monochromator, an ultra continuous white light source, a detector, two phase-locked amplifiers and a chopper. By utilizing the system disclosed by the invention, the polarization resolution differential reflection spectrum of a sample at 77-300K can be measured by adopting a low temperature Dewar, thus the energy band structure and characteristics of substances related to spin can be researched and analyzed.

Description

technical field [0001] The present invention relates to the technical field of semiconductor spintronics, in particular to a polarization-resolved differential reflection spectrum measurement system for measuring the spin-dependent optical properties of semiconductor spintronics materials (such as dilute magnetic semiconductor materials) . Background technique [0002] Since the giant magnetoresistance (Giant Magneto Resistance) effect was discovered in the Fe / Cr multilayer structure in 1988, in the past 20 years, another intrinsic property of electrons, spin, has been used to act as electron charges. It is similar in the field of modern information technology. The new subject of the role of spintronics, both in the laboratory and in the industry, has made amazing developments. [0003] In the study of spintronics, the optical properties of polarization resolution are very important research contents: for the so-called dilute magnetic semiconductors such as GaAs:Mn, due to ...

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Problems solved by technology

[0004] At this stage, the more common devices for measuring reflectance spectra in the laboratory mostly use electrical modulation and optical modulation to measure reflectance spectra, but the sensitivity still needs to be improved, and the complexity of the experiment needs to be reduced

For the polarization-resolved reflectance spectrum, a photoelastic modulator is usually used to obtain a periodically changing circularly polarized light, which makes it impossible to obtain reflectance spectra of different polarizations separately. Therefore, a sensitive and simple polarization-resolved reflectance Spectrum measurement system is very necessary

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