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Configurable test suite

A technique for configuring data, diagnostic tests, used in the detection of faulty computer hardware, error detection/correction, instrumentation, etc.

Inactive Publication Date: 2014-07-23
GM GLOBAL TECH OPERATIONS LLC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this approach results in unnecessary testing in both microprocessors

Method used

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  • Configurable test suite
  • Configurable test suite
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Embodiment Construction

[0066] The following description is merely exemplary in nature and is not intended to limit the disclosure, its application or uses.

[0067] refer to figure 1 , which is indicated by reference numeral 10 as a schematic diagram of an exemplary test system. The test system 10 is used to monitor the control module 18, which is preferably an electronic control device having the following components: a pre-programmed digital computer or processor, control logic, memory for storing data, and at least one I / O oPeripherals. The control logic includes a number of logic routines to monitor, manipulate and generate data. The control module 18 includes a computer readable storage medium 20 and a program 22 . In the illustrated embodiment, program 22 is an object-oriented programming environment. Programs 22 are used to manipulate data and contain a variety of different data structures. In the illustrated embodiment, the data structures are represented as data classes, however it is ...

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Abstract

The present invention relates to configurable test suites. In particular, a system and method for testing a module including a microprocessor having a programming environment is provided. The programming environment has a test data structure, a configuration data structure, and a monitoring data structure, each of which contains data. At least one instance of test data is associated with the test data structure, and at least one instance of configuration data is associated with the configuration data structure. The configuration data instances are diagnostic tests that monitor parameters of the microprocessor, and the monitoring data structure creates test data instances such that each test data instance corresponds to one of the configuration data instances. The program includes first control logic associating test data structures, configuration data structures, and monitoring data structures as part of a core infrastructure portion of a programming environment, wherein the core infrastructure portion of the program is static.

Description

technical field [0001] The present disclosure relates to a system and method for testing a microprocessor, and more particularly to a system and method for testing a microprocessor including a program (with a static part and a dynamic part). Background technique [0002] The statements in this section merely provide background information related to the present disclosure and may or may not constitute prior art. [0003] Health monitoring test systems are typically used to check for errors generated by the hardware or software of a computing system's microprocessor. Included in the test system is a test suite that performs a series of tests to monitor different parameters of the microprocessor. Deciding which tests to include in a test sequence is an important factor to consider when designing a test suite, because executing too many tests can be expensive and waste computer memory and CPU processing power. At the same time, it is desirable to provide a test system that is...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG06F11/2236
Inventor O.R.范埃克马霍姆斯R.L.舒巴赫J.K.托马斯
Owner GM GLOBAL TECH OPERATIONS LLC