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Vertical testing scheme of light emitting diode

A technology for light-emitting diodes and testing solutions, applied in the direction of testing optical performance, etc., can solve the problems of inability to test light-emitting diodes, and achieve the effect of enhanced interchangeability

Active Publication Date: 2012-01-18
SHENZHEN HI TEST SEMICON EQUIP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The disadvantage of the existing scheme is that this test scheme is only effective for side-emitting SMD LEDs, and cannot be tested for top-emitting LEDs that account for a large market share.

Method used

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  • Vertical testing scheme of light emitting diode
  • Vertical testing scheme of light emitting diode

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Experimental program
Comparison scheme
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Embodiment Construction

[0015] see figure 1 , a kind of light-emitting diode vertical test scheme of preferred embodiment provided by the present invention, this scheme comprises:

[0016] Firstly: Screen the light-emitting diodes through the side-emitting vibration plate, so that the side-emitting light-emitting diodes stand upright and enter the front end of the vibration plate;

[0017] Then use the feeding device to suck out the standing side-emitting LED from the front end of the vibrating plate, and put it into the suction nozzle of the rotating work disk. The vacuum will suck the side-emitting LED from the side and stick it to the suction nozzle. superior;

[0018] Finally, the pins of the side-emitting light-emitting diodes are clamped from the side by the probes clamped horizontally, and then energized and detected.

[0019] The present invention is mainly aimed at the improvement of the light-emitting diode test scheme. The above description is only a preferred embodiment of the present i...

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Abstract

The invention relates to a vertical testing scheme of a light emitting diode, which comprises the steps of: firstly, screening the light emitting diode through a vertical vibration disk to ensure that the light emitting surface of the light emitting diode upwards enters the most front end of the vibration disk; secondly, sucking the vertical light emitting diode from the most front end of the vibration disk through a feeding device, placing in a suction nozzle of a rotary working table, sucking and attaching the light emitting diode on the suction nozzle from the lateral side by the suction nozzle in vacuum; and finally, clamping a pin of the light emitting diode from the lateral surface by a horizontally clamped probe, electrifying, and detecting. The testing mode is consistent with the testing mode of other types of light emitting diodes, thus a testing device of the light emitting diode with a lateral light emitting is better exchanged with testing devices of other types of light emitting diodes.

Description

technical field [0001] The present invention relates to a test scheme of light-emitting diodes, and further relates to a test scheme by changing the placement position of light-emitting diodes. Background technique [0002] Several important aspects of the optical parameters of light-emitting diodes are: luminous flux, luminous efficiency, luminous intensity, light intensity distribution, and wavelength. Luminous efficiency characterizes the energy-saving characteristics of the light source, which is an important indicator to measure the performance of modern light sources. Therefore, the diode must be tested before it leaves the factory. [0003] At present, the test scheme of side-emitting SMD LEDs on the market is to use the suction nozzle to absorb the LEDs on the disk, and then press down the disk as a whole, so that the pins of the LEDs are in contact with the probe components below, so that Make the light-emitting diode energized to emit light, and test the light-em...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 刘骏卓维煌
Owner SHENZHEN HI TEST SEMICON EQUIP