Frequency response characteristic analyzing method of whole consisting of photoelectric tracking system and vibration isolating device

Abstract

The invention provides a frequency response characteristic analyzing method of a whole consisting of a photoelectric tracking system and a vibration isolating device. Aiming at the problem that a frequency response characteristic changes after the photoelectric tracking system is mounted on the vibration isolating device, according to the frequency response characteristic analyzing method, the vibration isolating device is equivalent to elastic support and damping connection mounted at the bottom of a base of the photoelectric tracking system; the vibration isolating device together with a frame and the base of the photoelectric system is taken as the whole; and the frequency response characteristic is analyzed when the whole is taken as a controlled object. The specific method comprises the following steps: regarding the vibration isolating device and the photoelectric tracking system as a complete system, first, analyzing kinetic relationships among all components of the system, and then, deducing the frequency response characteristic according to actual requirements by relevant formulas of the kinetic relationships. By using the frequency response characteristic analyzing method, the negative influence brought about by the vibration isolating device is decreased beneficially through analyzing the frequency response characteristic when the whole is taken as the controlled object.

Description

technical field [0001] The invention belongs to the technical field of photoelectric tracking control, in particular to a method for analyzing the frequency response characteristics of a photoelectric tracking system and a vibration isolation device as a whole. Background technique [0002] For optoelectronic tracking systems based on moving carriers (vehicle platforms, aircraft, satellites), in order to avoid the influence of random vibration during carrier movement on the imaging quality of the optical system, mechanical vibration isolation devices are often installed under the base of the optoelectronic system. These vibration isolation devices themselves have low stiffness and can be regarded as elastic supports and damping connections between the base and the carrier. Due to the limitation of the load capacity of the carrier and the load capacity of the vibration isolation device, the moment of inertia of the photoelectric system base installed on the vibration isolatio...

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Problems solved by technology

[0003] The technical problem to be solved in the present invention is: in order to overcome the weak point of prior art, such as figure 1 The photoelectric tracking system based on the moving carrier shown, due to the existence of the vibration isolation device, the overall stiffness coefficient and natural resonance frequency of the system will change greatly, which is very likely to be similar to or coincide with the operating frequency of the photoelectric tracking system, thereby affecting For the normal operation of the photoelectric tracking system, the present invention provides an analysis method for the frequency response characteristics of the whole composition of the photoelectric tracking system and the vibration isolation device, so as to avoid that the natural frequency of the system as a whole and the operating frequency of the photoelectric tracking system are similar or coincident, so as not to affect The normal operation of the photoelectric tracking system, so as to eliminate the adverse effects brought by the vibration isolation device

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