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Analysis device of embedded memory in panel driving circuit and method thereof

A panel drive circuit, embedded memory technology, applied in static memory, instruments, etc., can solve the problems of design, increase test cost and analysis and verification time, improve process defects, save test cost and analysis and verification time, The effect of improving product yield

Active Publication Date: 2015-01-14
ORISE TECH CO LTD
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  • Description
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Problems solved by technology

However, the general panel drive circuit does not have specific signal pins specially designed for the test of the embedded memory, so the signal transmission and testing of the embedded memory must be carried out through other signal pins on the panel drive circuit
If the test of the panel driving circuit is completed by its own unique test equipment, and the embedded memory uses special memory test equipment, this will greatly increase the test cost and the time for analysis and verification

Method used

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  • Analysis device of embedded memory in panel driving circuit and method thereof
  • Analysis device of embedded memory in panel driving circuit and method thereof
  • Analysis device of embedded memory in panel driving circuit and method thereof

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Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and examples.

[0028] figure 1 It is a schematic block diagram of an analysis device for an embedded memory in a panel drive circuit according to an embodiment of the present invention. Please refer to figure 1 The analyzing device 100 for the embedded memory in the panel driving circuit includes a testing unit 101 , an capturing unit 102 , a converting unit 103 , an analyzing unit 104 and a verifying unit 105 . The analysis device 100 for the embedded memory in the panel driving circuit is suitable for testing the embedded memory 111 in the panel driving circuit 110, wherein the panel driving circuit 110 is located on a wafer (not shown).

[0029] The test unit 101 is coupled to the panel drive circuit 110, and tests the panel drive circuit 110 through a plurality ...

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Abstract

The invention provides an analysis device of an embedded memory in a panel driving circuit and a method thereof. The device and method are suitable for testing the embedded memory of a panel driving circuit. The analysis device comprises a test unit, an acquisition unit, a conversion unit and an analysis unit. The test unit is used for testing the embedded memory through a signal pin on a panel driving circuit. The acquisition unit is used for acquiring the fail datalog. The conversion unit is used for converting the fail datalog into bitmap data. And the analysis unit is used for carrying out failure mode analysis based on the bitmap data. Thus, the analysis device of the invention can rapidly and economically finish analyzing the embedded memory of the panel driving circuit.

Description

technical field [0001] The present invention relates to a device and method for analyzing faults of embedded memory, in particular to a device and method for analyzing embedded memory in a panel drive circuit. Background technique [0002] Today's system-on-chip design heavily utilizes embedded memory, which occupies a high proportion of the chip area. According to the forecast of the Semiconductor Industry Association (Semiconductor Industry Association), by 2014, the proportion of the chip area occupied by embedded memory will be as high as 90%. In addition, because embedded memory usually has the most stringent design requirements, and the development trend of semiconductor size reduction continues to challenge the limit of semiconductor process capabilities, embedded memory is relatively prone to process defects, so embedded memory has a great impact on system chips. The design often causes an impact on yield and stability. Therefore, how to maintain a reasonable yield...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
Inventor 陈志仁
Owner ORISE TECH CO LTD
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