An Active Beam Scanning Metamaterial
A beam scanning and metamaterial technology, applied in the field of metamaterials, can solve the problems of high cost of phase shifters, unfavorable industrialization in the field of antenna and radar, and achieve the effect of simple structure, low cost, and easy industrialization
Active Publication Date: 2015-12-16
KUANG CHI INST OF ADVANCED TECH +1
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Problems solved by technology
The cost of the phase shifter used in the existing phased array technology is high, which is not conducive to the industrialization in the field of antenna and radar
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[0017] "Metamaterial" refers to some artificial composite structures or composite materials with extraordinary physical properties that natural materials do not have. Through the orderly design of the structure on the key physical scale of the material, the limitation of some apparent natural laws can be broken through, so as to obtain the supernormal material function beyond the ordinary nature inherent in nature.
[0018] Three important features of "metamaterials":
[0019] (1) "Metamaterials" are usually composite materials with novel artificial structures;
[0020] (2) "Metamaterials" have extraordinary physical properties (often not available in natural materials);
[0021] (3) The properties of "metamaterials" are jointly determined by the intrinsic properties of the constituent materials and the artificial microstructures in them.
[0022] As shown in Figures 3 to 4, the active beam scanning metamaterial according to the present invention includes a substrate 1 and a...
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The invention relates to an active beam scanning metamaterial, wherein the metamaterial comprises a substrate and a plurality of metal microstructures attaching on the substrate; a semiconductor element is arranged on each metal microstructure; an external interface is reserved for each metal microstructure by the active beam scanning metamaterial, so that the external voltage signal can be loaded on each semiconductor element by the external interface. According to the active beam scanning metamaterial, the electronic characteristic of the semiconductor element is changed due to the fact that the external voltage signal is loaded on the semiconductor element on the metal microstructure, so that the adjustability of each metal microstructure for electric field response is achieved; the electromagnetic wave can produce different phase shifts by each metal microstructure, and then each metal microstructure unit in the metamaterial can be used as an electrically-controlled phase shifter. The phased array effect can be achieved by designing phase shift amount of each phase shifter.
Description
technical field [0001] The invention belongs to the field of metamaterials, and in particular relates to an active beam scanning metamaterial. Background technique [0002] Beam scanning has a very wide range of applications in communications and radar. Basically, there are two ways to realize beam scanning: mechanical and non-mechanical. The mechanical type refers to the use of a complex servo system to realize the orientation change of the antenna face. The non-mechanical type usually refers to a phased array, that is, there are many units, and each unit radiates outward, and these radiations are superimposed into a very narrow beam. Changing the relative phase of each unit (realized by adding a phase shifter to each unit) can change the direction of the superimposed beam. The cost of the phase shifter used in the existing phased array technology is high, which is not conducive to the industrialization in the field of antenna and radar. Contents of the invention [0...
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IPC IPC(8): H01Q1/38H01Q3/44
Inventor 刘若鹏徐冠雄张洋洋
Owner KUANG CHI INST OF ADVANCED TECH