Light-emitting diode (LED) ageing test system and method
A technology of aging test and test system, applied in the direction of testing optical properties, single semiconductor device testing, etc., can solve the problem of low efficiency, ignoring temperature characteristics, and not fully considering the LED temperature characteristics of forward voltage drop and reverse leakage test Methods and other issues to achieve the effect of comprehensive functions and high efficiency
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[0035] In order to further illustrate the technical means adopted by the present invention and its effects, the following will be described in detail in conjunction with the embodiments of the present invention and the accompanying drawings, wherein the same reference numerals always represent the same components.
[0036] The explanation of some words used in the present invention is firstly described below, constant current aging: LED is lighted and aged with a fixed forward current; Reverse impact aging: LEDs are aged alternately with forward pulse current and reverse pulse voltage.
[0037] like figure 1 As shown, the LED aging test system can test multiple LEDs at the same time. The test system includes: a visual human-computer interaction module 1, a microprocessor module 2, a tested module 3 and a test module 4; 1 Select a test mode, the test mode is displayed on the visual human-computer interaction module 1, according to the test mode displayed on the visual human-co...
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