led aging test system and its test method
A technology of aging test and test system, which is applied in the direction of testing optical performance, single semiconductor device testing, etc., which can solve the test of low efficiency, ignoring temperature characteristics, and not fully considering the forward voltage drop and reverse leakage of LED temperature characteristics. methods and other issues to achieve high efficiency and comprehensive functions
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[0035] In order to further illustrate the technical means adopted by the present invention and its effects, the following will be described in detail in conjunction with the embodiments of the present invention and the accompanying drawings, wherein the same reference numerals always represent the same components.
[0036] The explanation of some words used in the present invention is firstly described below, constant current aging: LED is lighted and aged with a fixed forward current; Reverse impact aging: LEDs are aged alternately with forward pulse current and reverse pulse voltage.
[0037] Such as figure 1 As shown, the LED aging test system can test multiple LEDs at the same time. The test system includes: a visual human-computer interaction module 1, a microprocessor module 2, a tested module 3 and a test module 4; 1 Select a test mode, the test mode is displayed on the visual human-computer interaction module 1, according to the test mode displayed on the visual human...
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