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Device and method for measuring temperature and concentration of multi-component welding arc plasma

An arc plasma, concentration measurement technology, applied in measuring devices, thermometers, measuring heat, etc., can solve problems such as high precision, and achieve the effect of overcoming the requirements of physical properties of components

Active Publication Date: 2013-04-03
SHANGHAI JIAO TONG UNIV
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Problems solved by technology

The imaging system in this device is composed of multi-level optical paths, which requires high precision and is also subject to certain restrictions in application.

Method used

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  • Device and method for measuring temperature and concentration of multi-component welding arc plasma
  • Device and method for measuring temperature and concentration of multi-component welding arc plasma

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Embodiment Construction

[0033] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0034] figure 1 It is a structural schematic diagram of the temperature and concentration measurement device for multi-component welding arc plasma provided by the present invention. Specifically, in this embodiment, the temperature and concentration measurement device for multi-component welding arc plasma includes a middle A characteristic optical filter 2, a narrow-band optical filter 3, a macro lens 4, a CMOS high-speed camera 5, a tripod 6 for fixing the CMOS high-speed camera 5, an acquisition...

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Abstract

The invention provides a method for measuring temperature and concentration of multi-component welding arc plasma. The method comprises constructing measuring device, which comprises a neutral light filter, a narrow-band light filter, a micro-lens, a complementary metal oxide semiconductor (CMOS) high-speed camera, and a tripod used for fixing the CMOS high-speed camera, wherein the micro-lens is arranged on the CMOS high-speed camera; and the narrow-band light filter and the neutral light filter are sequentially arranged in the outward direction of the micro-lens. An atomic spectral line of a certain element and an ionic spectral line of the primary ionization are selected, the requirements of the conventional method on the physical characteristics of components are met, and the device is applied to the field of welding disc spectrum diagnosis and can be widely applied to measuring the temperature and the concentration of the welding arc plasma with different components.

Description

technical field [0001] The invention relates to the field of temperature measurement and control, in particular to a method for measuring welding arc plasma temperature and concentration and a plasma collection device based on high-speed photography. Background technique [0002] The temperature and concentration of arc plasma are two important and basic parameters to describe the welding process, and are also the basic characterization of various physical and chemical reactions and metallurgical reactions in the welding arc zone, which directly affect the weld formation and welding quality. Quantitative analysis of these reaction parameters and monitoring of the welding process is of great significance for controlling weld formation and improving welding quality. The premise of the current research on welding arc plasma is to assume that there is only one component in the arc, and to measure the temperature, mainly using spectroscopic methods. Spectroscopy is a measurement...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01K13/00G01N21/73
Inventor 华学明肖笑汪琳斯红吴毅雄
Owner SHANGHAI JIAO TONG UNIV
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