Unlock instant, AI-driven research and patent intelligence for your innovation.

Method and device for analyzing the optical quality of a transparent substrate

A technology of analysis device and matrix, which is applied in measurement device, material analysis by optical means, analysis of materials, etc., can solve problems such as measurement incompatibility, and achieve the effect of fast and reliable inspection

Active Publication Date: 2013-05-08
SAINT-GOBAIN GLASS FRANCE
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0018] Therefore, the device described in US 6 208 412 and its measurement process are not compatible with the measurement on industrial lines of continuously moving continuous substrates limited by exhaustive inspection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for analyzing the optical quality of a transparent substrate
  • Method and device for analyzing the optical quality of a transparent substrate
  • Method and device for analyzing the optical quality of a transparent substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0075] When the support plate 11 is translucent, such as a white plastic sheet, the lighting system 4 can be a backlight system. Preferably, the lighting system 4 then consists of a number of light emitting diodes positioned behind the translucent support plate.

[0076] As a variant, when the support plate 11 is not transparent, the illumination system 4 is formed by a light source arranged on the front of the scale, for example a directional spot for illuminating the front of the support plate of the scale.

[0077] Camera 3 is a linear camera; it produces image frames which are stacked with previous frames by digital processing for forming an overall two-dimensional image of the moving substrate. As will be seen, since the scale is smaller than the substrate, either the substrate 2 or the scale can be moved relative to each other to ensure that the desired number of images over the entire substrate is obtained. The frequency with which the camera is triggered for each imag...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This device (1) for analyzing a transparent surface of a substrate (2) comprises a gauge (10) disposed facing the surface of the substrate to be measured. The gauge is formed on a support (11) of small and large extensions. A camera (3) is provided so as to take at least one image of the gauge deformed by the measured substrate. A system (4) for illuminating the gauge and means (5) for processing the image and for numerical analysis are linked to the camera (3). The support (11) is of oblong form, the gauge is monodirectional, consisting of a pattern (10) which extends along the smallest extension of the support. The pattern (10) is periodic transversely to the small extension, and the camera is linear.

Description

technical field [0001] The invention relates to an optical mass analysis device of a transparent substrate, making it possible in particular to detect distorted optical defects present either on the surface of the substrate or in its body. Background technique [0002] Optical defects of transparent substrates are characterized by the optical distortions that occur when these substrates are in use conditions, such as in automotive glass, architectural glass, plasma or LCD display screens . . . [0003] Detection of optical defects in these substrates at the end of the production line, although this can prove effective from a quality control point of view, is usually expensive since the detection is carried out on the final product ready for shipment. It is obviously preferable to detect these defects as soon as possible, that is to say when the matrix that will be used to realize the final product is formed. [0004] Since these substrates are usually produced using a pultr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958
CPCG01N21/958G01N21/896G01N2021/9513
Inventor M.皮雄F.达韦纳
Owner SAINT-GOBAIN GLASS FRANCE