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Test and measurement instrument and method for template triggering on test and measurement instrument

A technology for measuring instruments and templates, applied in the direction of measuring electrical variables, instruments, measuring electricity, etc.

Active Publication Date: 2018-09-07
TEKTRONIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

More specifically, although the relationship between signals and signal components can be expressed in terms of space and / or time, traditional triggering methods lack the ability to combine time-related aspects of the signal under test to build correlation and trigger criteria around spatial aspects. ability

Method used

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  • Test and measurement instrument and method for template triggering on test and measurement instrument
  • Test and measurement instrument and method for template triggering on test and measurement instrument
  • Test and measurement instrument and method for template triggering on test and measurement instrument

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Embodiment Construction

[0018] Reference will now be made in detail to embodiments of the invention, examples of which are illustrated in the accompanying drawings. In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the inventive concept. However, it is understood that one of ordinary skill in the art may practice the inventive concept without these specific details. In other instances, well-known methods, procedures, components, circuits, and networks have not been described in detail so as not to unnecessarily obscure aspects of the embodiments.

[0019] It will be understood that, although the terms first, second, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first trigger template could be called a second trigger template, and similarly, a second trigger template could be called ...

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PUM

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Abstract

The present invention relates to combined template triggering in the time or frequency domain. Embodiments of the present invention include methods and apparatus for performing combinatorial template triggering. Ability to configure one or more template triggers. The combinatorial template trigger logic is capable of making various determinations regarding the relationship between the digitized signal and one or more template triggers. Various determinations of the relationship may include consideration of both space and time. When the combined trigger criteria have been met, a trigger signal is generated and the digital data associated with the incoming signal is stored to memory. Combinatorial mask trigger logic can operate on signals in the frequency domain, time domain, or both.

Description

technical field [0001] Embodiments of the invention relate to mask triggering, and more particularly, to combined mask triggering in the time or frequency domain on test and measurement instruments. Background technique [0002] Modern test and measurement instruments, such as high-speed digital oscilloscopes, include acquisition systems that capture measurement data pertaining to incoming electrical signals under test. Different kinds of criteria can be used to trigger the acquisition of data on a test and measurement instrument. For example, triggering can be based on a "template area" defined within the drawing plane of the display device. The trigger logic is capable of detecting excursions of trace components represented by pixels drawn on the display within the template region and, in response, causing a template fault and / or trigger event to occur. [0003] In a traditional frequency mask trigger system, the spectrum acquisition process is "free-running," or in othe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R13/02G01R23/00G01R31/00G01R31/3177
CPCG01R13/0254G01R23/16G01R13/20G01R13/22G01R23/165
Inventor K.P.多比恩斯G.J.沃尔多
Owner TEKTRONIX INC