Testing device for port

A technology for port testing and testing sockets, which is applied in measuring devices, measuring electrical variables, error detection/correction, etc. It can solve problems such as hindering test efficiency, increasing test volume, and cumbersome testing, so as to protect product performance and improve work efficiency. The effect of the quick detection function

Inactive Publication Date: 2014-06-18
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Such repeated operations will not only lead to cumbersome testing, increase the amount of testing, and hinder the improvement of testing efficiency, but also cause damage to the probe due to repeated insertion and removal of the test probe

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing device for port

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0012] Please refer to figure 1 , the port testing device 10 of the preferred embodiment of the present invention includes a circuit board 15, on which a test socket 11, two dynamic arms 12, PCIE (Peripheral Component Interconnect Express, peripheral equipment quick connection) connector 14 are arranged on the circuit board 15 And several cables 13, wherein these cables 13 can be electrically connected with the test socket 11 through the dynamic arm 12, so as to realize the transmission of several test signals.

[0013] The test socket 11 is a pair of multi-function processing sockets formed by two symmetrically arranged connectors, that is, SMP (Symmetrical Multi-Processing, symmetrical multi-processing) sockets.

[0014] Each dynamic arm 12 includes a fixed end 120 pivotally fixed on the circuit board 15 and a connecting end 121 away from the test socket 11 . The dynamic arm 12 is a metal rod made of conductive metal such as copper, aluminum or iron, and the two connectors ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a testing device for port, and the testing device for port is used for detecting whether the transmission signal at the periphery interface of the electronic device is normal, the testing device comprises a circuit board, provided with a connector matching with the port to be tested, a testing socket, a first dynamic arm and a plurality of cables, one end of the first dynamic arm is pivoted and fixed on the circuit board and electrically connected with the testing socket, one end of each cable is connected to the corresponding terminal of the connector while the other end of each cable is fixed on the circuit board, and the other end of the first dynamic arm can contact the other end of each cable while the first dynamic arm rotates. The testing device for port can avoid tedious work caused by inserting or pulling out the detection probe and switching and protect the detection probe away from damage, so as to raise the work efficiency and protect the product performance.

Description

technical field [0001] The invention relates to a port testing device, in particular to a testing device for peripheral interface equipment of a computer mainframe. Background technique [0002] In recent years, with the rapid development of electronic communication technology, computer connection bus and interface standards have been gradually updated and improved. The host computer peripheral interface includes: traditional AGP (Accelerate Graphical Port, fast graphics interface) interface, PCI (Peripheral Component Interconnect, peripheral component connection) interface and the new standard PCIE (Peripheral Component Interconnect Express, peripheral equipment fast connection) interface, and has The new standard PCIE interface with higher transmission rate and greater compatibility has gradually replaced the traditional PCI interface and AGP interface. [0003] Usually, when people test the PCIE interface, the test fixture used includes several SMP (Symmetrical Multi-Pro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
CPCG01R1/0408G06F11/221
Inventor 余松
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products