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Detector used for three-dimensional shape measuring device

A measuring device and a three-dimensional shape technology, which can be used in the direction of measuring devices, optical devices, devices for capturing or killing insects, etc., can solve the problems of easy vibration, lower natural vibration frequency of detectors, lower rigidity, etc.

Active Publication Date: 2014-07-23
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, when the thickness of the leaf spring is reduced, the rigidity decreases, and when the thickness of the leaf spring is increased, the mass of the movable part increases, so the natural frequency of the detector decreases.
When the natural vibration frequency is lowered, it becomes easy to cause vibration during measurement, and measurement data may cause measurement errors due to vibration

Method used

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  • Detector used for three-dimensional shape measuring device
  • Detector used for three-dimensional shape measuring device
  • Detector used for three-dimensional shape measuring device

Examples

Experimental program
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Effect test

Embodiment Construction

[0042] Hereinafter, a probe for a three-dimensional shape measuring device (hereinafter referred to as probe 1 ) according to an embodiment of the present invention will be described with reference to the drawings.

[0043] First, refer to Figure 1 to Figure 4 Probe 1 will be described. figure 1 It is a perspective view showing the appearance of the probe 1 in Embodiment 1 of the present invention. figure 2 will be figure 1 A perspective view showing a part of the detector 1 cut along the A-A plane (XZ plane). image 3 yes figure 1 The cross-sectional view of the B-B plane (YZ plane). Figure 4 is only decomposed figure 1 A perspective view of the movable part in .

[0044] exist figure 1 Among them, the probe 1 is detachably attached to the three-dimensional shape measuring device 201 via the cylindrical attachment portion 2 which is opened at both ends as a whole. The upper end side of the lock member 5 is fixed and attached to the lower portion of the attachm...

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Abstract

The invention provides a detector used for a three-dimensional shape measuring device, and as measurement forces are small in the measurement of a vertical plane and a horizontal plane, vibration is hard to generate. The detector used for the three-dimensional shape measuring device has an installation part mounted on the three-dimensional shape measuring device, a swing part connected with the installation part in a swing manner, an arm support part maintained to move up and down with respect to the swing part, and an arm hung down from the lower end of the arm support part and configured at the lower part. The arm support part moving up and down with respect to the swing part comprises a swing side member, an arm side component, and five balls composed of magnetic bodies and contacted with vertical planes of swing side component and the arm side component opposite to each other. The balls are contacted with and roll between the swing side component and the arm side component under the action of magnetic attraction forces, so that the arm support part moves on a vertical axis. In addition, in order to apply magnetic attraction forces among the swing side component and the arm side component, resilient forces are applied with respective to movement of the arm support part on the vertical axis.

Description

technical field [0001] The present invention relates to a probe for a three-dimensional shape measuring device that scans and measures a three-dimensional shape with high precision and low measuring force. Background technique [0002] A conventional probe for a three-dimensional shape measuring device (hereinafter, referred to as a probe) capable of scanning and measuring the three-dimensional shape of an object to be measured with high precision and low measuring force has the configuration disclosed in Patent Document 1. Figure 12 , 13 The configuration of the probe disclosed in Patent Document 1 is shown. [0003] exist Figure 12 Among them, the probe 101 is detachably mounted on the three-dimensional shape measuring device 201 via the mounting member 102 . The swing part 103 is swingably connected to the mounting table 104b fixed to the lower part of the attachment member 102, and the arm attachment part 120 is held by the swing part 103 so as to be movable up and do...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
CPCA01C7/00A01M9/00A01G24/60
Inventor 舟桥隆宪
Owner PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD
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