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Software Defect Location Method Based on Spectrum Information Deredundancy Optimization

A technology of spectrum information and software defects, applied in the field of software testing, which can solve the problems of unrealistic static analysis and large static information overhead.

Active Publication Date: 2017-04-26
NANJING UNIV OF POSTS & TELECOMM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the overhead of obtaining static information is relatively large. For large-scale software, comprehensive static analysis is even unrealistic. As long as the collection of dynamic information is to run test cases, it will not bring too much overhead to the test.

Method used

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  • Software Defect Location Method Based on Spectrum Information Deredundancy Optimization
  • Software Defect Location Method Based on Spectrum Information Deredundancy Optimization
  • Software Defect Location Method Based on Spectrum Information Deredundancy Optimization

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Embodiment Construction

[0085] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0086] In order to improve the quality of software and reduce the cost of software development, it is first necessary to improve the efficiency of software defect location. The purpose of this embodiment is to adopt an optimization strategy on the basis of the original frequency spectrum-based software defect location method, perform de-redundancy processing on the collected spectrum information, improve the reliability of defect location based on suspiciousness, thereby improving software The efficiency of defect location finally achieves the purpose of reducing the cost of software development.

[0087] The software defect locating method for spectrum information de-redundancy optimization in this embodiment is a method for locating errors by obtaining dynamic information by executing test cases. In this embodiment, program information and...

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Abstract

The invention provides a method for positioning software defects by redundancy removing and optimizing of frequency spectrum information. A test case is operated, operation result information, namely the frequency spectrum information, of a program is collected; redundancy removing and optimizing treatment is performed on the obtained frequency spectrum information, and the frequency spectrum information is utilized for calculating equivocation; according to the equivocation value, descending ordering is performed on statements, and according to the ordered statement sequence, error removal is gradually performed in a one-by-one mode until the statement causing the program abnormity is found. According to the error positioning method based on frequency spectrum, before a covering information table is utilized for performing equivocation calculation, redundancy removing treatment is performed on the frequency spectrum information, the effective frequency spectrum information is utilized for performing equivocation calculation, reliability of defect positioning is improved according to equivocation, and therefore the efficiency of software defect positioning is improved.

Description

technical field [0001] The invention relates to a software defect location method for spectrum information de-redundancy optimization, which belongs to the field of software testing. Background technique [0002] Over the years, people have proposed many methods in the study of defect location, mainly using the static information and dynamic information of the program to locate program errors. However, the overhead of obtaining static information is relatively large. For large-scale software, comprehensive static analysis is even unrealistic. However, as long as the collection of dynamic information is to run test cases, it will not bring too much overhead to the test. At the same time, since the dynamic information includes the information when the program is running, it can provide more accurate results compared with the method using static information. [0003] Using program spectrum information to locate defects is a more practical and effective software defect location...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 张卫丰张晓红王云王子元周国强张迎周
Owner NANJING UNIV OF POSTS & TELECOMM
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