Defect positioning method and device
A defect and software program technology, applied in the computer field, can solve problems such as unsuitable scenarios with a large number of source codes, high method complexity, and low static analysis efficiency
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[0059] Specific embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present disclosure, and are not intended to limit the present disclosure.
[0060] Please refer to figure 1 , figure 1 It is a flowchart of a method for locating a defect according to an exemplary embodiment. Such as figure 1 As shown, the method includes the following steps:
[0061] Step S11: extracting abnormal stack data from the running log file of the software program;
[0062] Step S12: According to the abnormal stack data, determine the defect parameters, the defect parameters include: the number of occurrences of the method in which the defect occurred in the software program, the number of occurrences of the method calling the method in which the defect occurred, and the The number of times the flawed method was called...
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