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Semiconductor chip test socket that can automatically position the chip

A chip testing and automatic positioning technology, which is applied to the casing of the measuring device, etc., can solve the problems of accurate testing and cannot be automatically positioned, and achieve the effects of easy removal, simple structure and convenient use.

Active Publication Date: 2017-01-11
FTDEVICE TECH (SUZHOU) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] To sum up, the chip test socket used in the current chip test has the problem that it cannot be automatically positioned according to the chip size for accurate testing

Method used

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  • Semiconductor chip test socket that can automatically position the chip
  • Semiconductor chip test socket that can automatically position the chip
  • Semiconductor chip test socket that can automatically position the chip

Examples

Experimental program
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Effect test

Embodiment Construction

[0026] The present invention will be described in detail below in conjunction with the accompanying drawings, so that those skilled in the art can better understand the present invention.

[0027] Such as figure 1 As shown, a semiconductor chip test socket capable of automatically positioning chips includes a test socket 1 , a test cover 2 and a hook structure 3 . The test cover 2 is arranged above the test seat 1, and the test cover 2 and the test seat 1 are snapped together through the hook structure 3; the hook structure 3 includes a hook, a pin and a return spring, and the hook is connected to the test cover 2 through a pin, The test socket 2 is provided with a card slot matching with the hook.

[0028] Such as Figure 2-4 As shown, the test seat 1 is provided with a positioning device 11, a lower rail groove 12, a lower cover plate 13, a spring probe and a bottom cover plate; the positioning device 11 includes a positioning slider 111 and a positioning slider return spr...

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PUM

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Abstract

The invention discloses a semiconductor chip testing plug base capable of automatically positioning a chip. The semiconductor chip testing plug base comprises a testing base and a testing cover. The testing cover is arranged at the upper portion of the testing base and connected with the testing base in a clamped mode. A movable positioning device is arranged on the testing base, and a locking device matched with the positioning device is arranged on the testing cover. According to the semiconductor chip testing plug base, due to the fact that positioning sliding blocks and header covers which are matched are arranged on the testing base and the testing cover, the chip is automatically positioned and fixed when the testing base is covered with the testing cover, and is fixed all the time in the testing process, and fixing of the chip is automatically released after the testing cover is taken down. Influences, caused by shaking and positional deviation of the chip in the testing process, on the testing result are effectively avoided.

Description

technical field [0001] The invention relates to a semiconductor chip testing device, in particular to a semiconductor chip testing socket capable of automatically positioning chips. Background technique [0002] The geomagnetic sensor is a measuring device that uses the different motion states of the measured object in the geomagnetic field to indicate the attitude and movement angle of the measured object by inducing the distribution change of the geomagnetic field. Because of its special functions, high integration and small size. Geomagnetic sensor chips are widely used in electronic wearable devices, navigators, aerospace navigation, car positioning, gesture control of electronic products, etc. With the requirements of the market, after improving the product performance of this type of chip, the test conditions of this type of chip are now highly demanding: when the chip is put into the test socket for testing, the chip is placed in the test socket The initial position...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04
Inventor 孙鸿斐贺涛
Owner FTDEVICE TECH (SUZHOU) CO LTD