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Method for determining yield of stratum element logging instrument by virtue of spectrum unfolding

A logging instrument and formation element technology, which is applied in the direction of instruments, special data processing applications, electrical digital data processing, etc., and can solve problems such as large errors

Inactive Publication Date: 2014-12-24
XIAN AOHUA ELECTRONICS INSTR +1
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Problems solved by technology

The types of stratum elements calculated by this spectrum analysis method will not be wrong, but for some elements with low content or low sensitivity, the calculation process has large errors

Method used

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  • Method for determining yield of stratum element logging instrument by virtue of spectrum unfolding
  • Method for determining yield of stratum element logging instrument by virtue of spectrum unfolding
  • Method for determining yield of stratum element logging instrument by virtue of spectrum unfolding

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Embodiment Construction

[0036] The method of the present invention to determine the yield is as follows:

[0037] 1. Calculate the normalized standard capture spectrum and calculate the response matrix A

[0038] The calculation method of response matrix A is as follows:

[0039] Let a ij Is the (i, j) element of the response matrix A, that is, the element in the i-th row and j-th column of A.

[0040] For the channel-by-channel least squares method, then

[0041] a ij =N ij i=1, 2,...256 (1)

[0042] Where N ij Is the i-th channel count of the j-th element after normalization of the standard spectrum.

[0043] 2. Calculate the measured formation capture spectrum and calculate the count of each section c i

[0044] Next, calculate the count of each section of the formation capture spectrum. Suppose the i-th channel count of the 256-channel gamma spectrum obtained in the actual measurement is c i .

[0045] Pairwise Least Squares

[0046] c i =N iM i=1, 2,...256 (3)

[0047] Where N iM It is the ith channel ...

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Abstract

The invention provides a method for determining the yield of a stratum element logging instrument by virtue of spectrum unfolding. The method comprises the following steps: calculating a standard capture spectrum normalization response matrix A, calculating actual measurement stratum capture spectrum count ci, calculating an opposite angle weighting matrix W, calculating the yield yj obtained by virtue of spectrum unfolding based on a weighted least squares method, and judging the fitting effect by use of residual sum of squares and the average number delta 2. According to the method, a one-by-one spectrum unfolding method is adopted, complete 256 energy windows are adopted for spectrum unfolding. According to MC numerical simulation, the method has slight influence on spectrum unfolding; a one-by-one method is adopted for performing spectrum unfolding on an unknown stratum, resolution result errors are large but can basically reflect the types and relative contents of elements in the stratum.

Description

Technical field [0001] The invention relates to a method for de-spectrum analysis and determination of a formation element logging tool. Background technique [0002] For formation element logging, the least square method or an improved method of least square method is generally used for spectrum analysis. The types of formation elements calculated by this spectrum solution method will not be wrong, but for some elements with low content or low sensitivity, the error is large in the calculation process. Summary of the invention [0003] The purpose of the present invention is to provide a method for determining yield by spectrum analysis of formation element logging tools, which can basically reflect the types and relative contents of formation elements. [0004] A method for determining yield by spectral analysis of formation element logging tools, which is special in that it includes the following steps: [0005] 1) Calculate the normalized response matrix A of the standard captur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 石文夫张政彬谭红建王志勇李国英张崇军于之深嵇成高
Owner XIAN AOHUA ELECTRONICS INSTR
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