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Defect-testing computer implementation method and computer

A computer and defect technology, applied in the field of testing, can solve problems such as failure to guarantee the standardization of defect information, time-consuming, and a large amount of time

Active Publication Date: 2015-02-18
电信科学技术第十研究所有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Whether it is fully manual or semi-manual, there will be the following disadvantages: 1. It takes a lot of time
During the input process, testers need to think about the description method, description content, and standardized terms, etc., which requires a lot of time; 2. The standardization of defect information cannot be guaranteed

Method used

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  • Defect-testing computer implementation method and computer
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  • Defect-testing computer implementation method and computer

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Embodiment Construction

[0033] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0034] An embodiment of the present invention provides a computer-implemented method for testing defects, referring to figure 1 As shown, the method includes:

[0035] 101. Acquire the defect type of the target test object.

[0036] 102. Acquire a defect information template matching the defect type according to the defect type of the target test object.

[0037] 103. Generate defect information corresponding to the target test object according to the defect information template.

[0038] The embodiment of the present invention provides a computer-implemented method for testing defects. When generating defect information, most of them are completed by selection. Only a small amount of manual input information is required, which saves...

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Abstract

The invention discloses a defect-testing computer implementation method and a computer, and belongs to the field of testing. The method comprises the following steps: acquiring the defect type of a target test object; acquiring a defect information template matched with the defect type according to the defect type of the target test object; generating defect information corresponding to the target test object according to the defect information template. According to the defect-testing computer implementation method provided by the invention, the generation of defect information is mostly finished in a selecting manner, and only a small amount of information needs to be input manually, so that the writing time is saved, the standardization of defect information description and the integrity of content are ensured, and the quality of the defect information is enhanced; meanwhile, statistical analysis can be performed on defects conveniently by using the standardized defect information content.

Description

technical field [0001] The invention relates to the field of testing, in particular to a computer-implemented method and computer for testing defects. Background technique [0002] Testing products before they are put on the market is one of the main methods to ensure product quality. One of the most important tasks is to write test defect records. Accurate, clear, concise and complete defect information can reduce the gap between testers, testers and The communication cost between R&D personnel can improve the accuracy of the quality assessment of test objects. The standardized writing method can improve the work efficiency of testers. [0003] At present, the generation of defect information is completed manually or semi-manually. The all-manual way is that the tester writes manually while testing during the test, or the tester writes by memory after the test is over. The semi-manual way of recording is that testers use some tools to complete the writing. [0004] Whet...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 高明雪赵越
Owner 电信科学技术第十研究所有限公司
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