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Customizing operation of a test instrument based on information from a system under test

一种测试仪器、信号的技术，应用在软件和可编程硬件的系统领域，能够解决大量编码和测试仪表知识、成本效率低、很差用户体验等问题

Active Publication Date: 2015-02-18
NATIONAL INSTRUMENTS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the second case, the user is forced to completely specify the functionality of the test instrument, which may require extensive coding and test instrument knowledge
Additionally, the requirement to provide all of this encoding can be extremely cost-ineffective
[0006] Therefore, these two examples of test instruments lead to a poor user experience

Method used

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  • Customizing operation of a test instrument based on information from a system under test
  • Customizing operation of a test instrument based on information from a system under test
  • Customizing operation of a test instrument based on information from a system under test

Examples

Experimental program
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Embodiment Construction

[0024] Incorporation by reference:

[0025] The following references are hereby incorporated by reference in their entirety as if fully and fully set forth herein:

[0026] U.S. Patent No. 4,914,568, issued April 3, 1990, entitled "Graphical System for Modeling a Process and Associated Method."

[0027] US Patent No. 5,481,741, entitled "Method and Apparatus for Providing Attribute Nodes in a Graphical Data Flow Environment."

[0028] US Patent No. 6,173,438, filed Aug. 18, 1997, entitled "Embedded Graphical Programming System."

[0029] U.S. Patent No. 6,219,628, filed August 18, 1997, entitled "System and Method for Configuring an Instrument to Perform Measurement Functions Utilizing Conversion of Graphical Programs into Hardware Implementations."

[0030] US Patent No. 7,210,117, filed December 20, 2000, entitled "System and Method for Programmatically Generating a Graphical Program in Response to Program Information."

[0031] the term

[0032] The following is a glo...

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Abstract

Customizing a test instrument. A plurality of pairs of code modules may be provided. Each pair of code modules may include a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware element of the test instrument. For each pair of code modules, the first code module and the second code module may collectively implement a function in the test instrument. User input may be received specifying modification of a second code module of at least one of the plurality of pairs of code modules. Accordingly, a hardware description may be generated for the programmable hardware element of the test instrument based on the modified second code module.

Description

technical field [0001] The present invention relates to test instruments, and more particularly to a system and method for customizing software and programmable hardware of test instruments. Background technique [0002] Test instruments are generally used to perform tests on a device under test (DUT) or a system under test (SUT). Test instruments typically include one or more inputs and outputs for connection to the SUT. These inputs and outputs may be analog, digital, radio frequency, etc., for example at various voltage levels and frequencies. A test instrument is generally capable of performing one or more tests or characteristics. For example, a test instrument may be configured to capture waveforms, calculate measured power, generate tones at programmed frequencies, and the like. Test instruments are also usually calibrated to achieve a specified level of accuracy on their I / O. For example, when a device is requested to generate a sine wave at 1V peak-to-peak, the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/263
CPCG06F11/263
Inventor C·G·斯科罗德尔C·F·格拉夫C·T·尼施古奇N·G·德索扎D·J·巴科尔T·D·玛格鲁德尔
Owner NATIONAL INSTRUMENTS